Papers Presented in Scientific Meetings with Refereed Proceedings (1996-2007)

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Page 2 (1996-2007)
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2007

80. J. Cocle, P. Hovington and R. Gauvin (2007), “EBSD Analysis of Deformed Materials”, Microscopy and Microanalysis, 13 (Supp.2), p. 1220-1221. Paper presented at the conference Microscopy & Microanalysis that was held in Fort-Lauderdale, FL, USA, from August 5-9.

 

79. C. Probst and R. Gauvin (2007), “Imaging of Carbon Nanotubes at High Spatial Resolution”, Microscopy and Microanalysis, 13 (Supp.2), pp. 1134-1135. Paper presented at the conference Microscopy & Microanalysis that was held in Fort-Lauderdale, FL, USA, from August 5-9.

 

78. P. Tetrault-Pinnard, P. Hovington and R. Gauvin (2007) “Comparison between Win-XRay and Peneloppe”, Microscopy and Microanalysis, 13 (Supp.2), pp. 942-943. Paper presented at the conference Microscopy & Microanalysis that was held in Fort-Lauderdale, FL, USA, from August 5-9.

 

77. D. Poirier and R. Gauvin (2007) “The Microstructure of Al Nanocomposites studied in electron Microscopy”, Microscopy and Microanalysis, 13 (Supp.2), pp. 1620-1621. Paper presented at the conference Microscopy & Microanalysis that was held in Fort-Lauderdale, FL, USA, from August 5-9.

 

76. R. Gauvin (2007), “X-Ray Microanalysis in the Variable Pressure Scanning Electron Microscope”, Proceedings of the Ninth Symposium of the Australian Microbeam Microanalysis Society (AMAS IX), p. 26. Paper presented at this conference that was held in Melbourne, Australia, from February 13-16.

 

2006

75. R. Gauvin (2006), “Advances in Characterization of Materials using FE-SEM”, Proceedings of the Conference of Metallurgist 2006, p. 129. Paper presented at this conference that was held in Montréal, Québec, Canada, from October 1-4.

 

74. P. Horny, R. Gauvin and H. Campbell (2006), "A New Method for Quantitative X-ray Microanalysis on a FEG-SEM", Microscopy & Microanalysis, Vol. 12, Supp. 2, pp. 54 – 55. Paper presented at the conference Microscopy & Microanalysis that was held in Chicago, USA, from July 30 to August 3.

 

73. H. Demers and R. Gauvin (2006), "Determination of the Backscattered Yield Coefficient by Monte Carlo Calculations and Comparison with Experimental Measurements", Microscopy & Microanalysis, Vol. 12, Supp. 2, pp. 854 - 855. Paper presented at the conference Microscopy & Microanalysis that was held in Chicago, USA, from July 30 to August 3.

 

72. P. T.-Pinard and Raynald Gauvin (2006), "Comparison of Monte Carlo Simulated k-ratios using WinX-Ray and WinCasino with Experimental Results", Microscopy & Microanalysis, Vol. 12, Supp. 2, pp. 868 - 869. Paper presented at the conference Microscopy & Microanalysis that was held in Chicago, USA, from July 30 to August 3.

 

71. J. Cocle, P. Hovington, M. Lagacé and R. Gauvin (2006), “Qualitative evaluation of EBSD technique for the study of plastic deformation”, Microscopy & Microanalysis, Vol. 12, Supp. 2, pp. 910 - 911. Paper presented at the conference Microscopy & Microanalysis that was held in Chicago, USA, from July 30 to August 3.

 

70. H. Demers, R. Gauvin, D. C. Joy and E. A. Kenik (2006), “Variations in Peak Position and Energy Resolution for a Microcalorimeter EDS by Temporal X-ray Spectroscopy”, Microscopy & Microanalysis, Vol. 12, Supp. 2, pp. 1442 - 1443. Paper presented at the conference Microscopy & Microanalysis that was held in Chicago, USA, from July 30 to August 3.

 

 

2005

69. D. Poirier, C. Gougeon, R. Gauvin and R. A. L. Drew (2005), “Fabrication by Powder Metallurgy of Aluminum Matrix/Carbon Nanotubes Composites”, Proceedings of the Materials Science and Technology Conference, pp. 926 – 937. Paper presented at this conference that was held in Pittsburgh, PA, from October 17-21.

 

68. R. Gauvin (2005), “How to Get the Best of Electron Microscopy with Monte Carlo Simulations”, Proceedings of the 8th Inter American Congress of Electron Microscopy (CIASEM), pp. 77 – 78. This conference was held in Havana, Cuba, from September 25-30. 

 

67. H. Demers, R. Gauvin, I. M. Anderson, D. C. Joy and E. A. Kenik (2005), “Deconvolution of Closely Spaced Spectral Features with a Microcalorimeter EDS”, Microscopy & Microanalysis, 11 (Supp. 2), p. 464 - 465. Paper presented at the conference Microscopy & Microanalysis that was held in Honolulu, HW, USA, from August 1-5.

 

66. H. Campbell, and R. Gauvin (2005), “Win X-ray, a Monte Carlo Program for X-ray Microanalysis in the Scanning Electron Microscope”, Microscopy & Microanalysis, 11 (Supp. 2), p. 1288 - 1289. Paper presented at the conference Microscopy & Microanalysis that was held in Honolulu, HW, USA, from August 1-5.

 

65. A.M. Elwazri, R. Varano, F. Siciliano, R. Gauvin and S. Yue (2005), “Microanalysis of Very Fine Precipitates by FE-SEM”, Microscopy & Microanalysis, 11 (Supp. 2), p. 1298 - 1299. Paper presented at the conference Microscopy & Microanalysis that was held in Honolulu, HW, USA, from August 1-5.

 

64. E. Lifshin, B. Thiel and R. Gauvin (2005), “The Validation of Monte Carlo Methods for Scanning Electron Microscopy and Electron Microprobe Analysis”, Microscopy & Microanalysis, 11 (Supp. 2), p. 1346 - 1347. Paper presented at the conference Microscopy & Microanalysis that was held in Honolulu, HW, USA, from August 1-5.

 

63. D. Wang, X. Du, J. J. Tunney, M. L. Post and R. Gauvin (2005), “TEM Characterization of Phase Separation and Transformation at the Thin Film Interfaces in the SrFeO2.5+x /SiO2/Si System”, Microscopy & Microanalysis, 11 (Supp. 2), p. 1962 - 1963. Paper presented at the conference Microscopy & Microanalysis that was held in Honolulu, HW, USA, from August 1-5.

 

62. D. Poirier, C. Gougeon, R. Gauvin and R.A.L. Drew (2005), “Aluminum Matrix Composite Reinforced with Carbon Nanotubes”, Proceedings of the International Conference on Powder Metallurgy & Particulate Materials (PM2TEC 2005), pp. 252 – 257. Paper presented at this conference that was held in Montréal, Québec, Canada, from July 4-8.

 

61. R. Gauvin (2005), “How to get the Best of a FE-SEM with Monte Carlo Simulations”, Proceedings of the the 32th Annual Conference of the Microscopical Society of Canada, p. 680 – 69. Paper presented at this conference that was held in Hamilton, Ontario, Canada, from May 18-20.

 

2004

60. D. Wang, X. Du, J. J. Tunney, M. L. Post and R. Gauvin (2004), “TEM Investigation of Interfacial Reactions between SrFeO Thin Films and Silicon, Sapphire Substrates”, Microscopy & Microanalysis, 10 (Supp. 2), p. 572 – 573. Paper presented at the conference Microscopy & Microanalysis that was held in Savannah, GA, USA, from August 1-5. 

 

59. Thuaire, C. Goujon, R. Gauvin and R. A. L. Drew (2004), “Study on the Fabrication of Aluminum Matrix Nanocomposites Reinforced with Carbon Nanotubes”, Microscopy & Microanalysis, 10 (Supp. 2), p. 574 – 575. Paper presented at the conference Microscopy & Microanalysis that was held in Savannah, GA, USA, from August 1-5. 

 

58. R. Gauvin, A. Thuaire, C. Goujon and R.A.L. Drew (2004), “Characterization of Carbon Nanotubes Coated with Cu”, Proceedings of the 8th Asia – Pacific Electron Microscopy Conference (8APEM), pp. 64 – 65. This conference was held in Kanazawa, Japan, from June 7-11.

 

57. R. Gauvin, C. Gougeon, A. Thuaire and R. A. L. Drew (2004), “Imaging of Nanomaterials in the FE-SEM”, Proceedings of the the 31th Annual Conference of the Microscopical Society of Canada, p. 40 – 41. Paper presented at this conference that was held in Wolfville, Novia Scotia, Canada, from May 11-15.  

 

2003

56. S. Duguey, R. Gauvin, P. Horny and T. Wright (2003), “Contrast of Multilayer Structures in a Field Emission Gun Scanning Electron Microscope”, Microscopy & Microanalysis, 9 (Supp. 2), pp. 988 - 989. Paper presented at the conference Microscopy & Microanalysis that was held in San Antonio, USA, from August 3-7.

 

2002

 

55. H. Demers and R. Gauvin (2002), “X-Ray Microanalysis of a Coated Non-Conductive Specimen: Monte Carlo Simulations”, Microscopy & Microanalysis, Vol. 8, Supp. 2, pp. 1462 – 1463.  Paper presented at the conference Microscopy & Microanalysis that was held in Québec City, Canada, from August 4-8.

 

54. H. Demers, P. Horny, R. Gauvin and E. Lifshin (2002), “WINX-Ray: A New Monte Carlo Program for the Simulation of X-Ray and Charging Materials”, Microscopy & Microanalysis, Vol. 8, Supp. 2, pp. 1498 – 1499. Paper presented at the conference Microscopy & Microanalysis that was held in Québec City, Canada, from August 4-8.

 

53. M. Brochu, D. Knuutila, M.D. Pugh, R. Gauvin and R.A.L. Drew (2002), “Utilisation of Field Emission SEM to Characterise an Active Brazing Alloy Produced by Electroless Plating Technique”, Microscopy & Microanalysis, Vol. 8, Supp. 2, pp. 708 – 709. Paper presented at the conference Microscopy & Microanalysis that was held in Québec City, Canada, from August 4-8.

 

52. M. A. Carpenter, E. Lifshin and R. Gauvin (2002), “SEM-EDS Quantitative Analysis of Aerosols”, Microscopy & Microanalysis, Vol. 8, Supp. 2, pp. 1482 – 1483. Paper presented at the conference Microscopy & Microanalysis that was held in Québec City, Canada, from August 4-8.

 

51. E. Lifshin, M. Hatzistergos, J. Reeves and R. Gauvin (2002), “Quantitative analysis of Yttrium Barium Copper Oxide Films on Strontium Titanate”, Microscopy & Microanalysis, Vol. 8, Supp. 2, pp. 1484 – 1485. Paper presented at the conference Microscopy & Microanalysis that was held in Québec City, Canada, from August 4-8.

 

50. J. Bong-Yong, S. Yue, R. Gauvin and R. A. L. Drew (2002), “Microstructure of TiN Coatings by EBSD Techniques”, Microscopy & Microanalysis, Vol. 8, Supp. 2, pp. 674 – 675. Paper presented at the conference Microscopy & Microanalysis that was held in Québec City, Canada, from August 4-8.

 

49. J. Bong-Yong, R. Gauvin and S. Yue (2002), “EBSD Study of Martensite in a Dual Phase Steel”, Microscopy & Microanalysis, Vol. 8, Supp. 2, pp. 700 – 701. Paper presented at the conference Microscopy & Microanalysis that was held in Québec City, Canada, from August 4-8.

 

48. H. Demers and R. Gauvin (2002), “Monte Carlo Simulations of a Non-Conductive Specimen”, Proceedings of the MSA/MAS/SMC/EMAS Workshop “Road Map on Materials Characterization using Microbeam Analysis”, p. 26. Paper presented at this workshop that was held in Montréal, Canada, from August 2-3.  

 

2000

47. R. Gauvin and D. C. Joy (2000), “On the Measurement of Total Elastic Cross-Sections in the ESEM of VPSEM using X-Ray Microanalysis”, Microscopy & Microanalysis, Vol. 6, Supp. 2, pp. 788-789. Paper presented at the conference Microscopy & Microanalysis 2000 which was held in Philadelphia, PA, USA, from August 13-17.

 

46. R. Gauvin (2000), “From the Scanning Electron Microscope to the Scanning Electron Macroscope with X-Ray Microanalysis in the ESEM”, Microscopy & Microanalysis, Vol. 6, Supp. 2, pp. 792-793. Paper presented at the conference Microscopy & Microanalysis 2000 which was held in Philadelphia, PA, USA, from August 13-17.

 

45. P. Horny, R. Gauvin, H. Demers, P. Hovington and S. Besner (2000) “Simulation of Energy Deposition in E-Beam Irradiated Polymers”, Proceedings of the 45th International SAMPE Symposium, pp. 1898-1903. Paper presented at the 45th International SAMPE (Society for the Advancement of Material and Process Engineering) Symposium which was held in Long Beach, CA, USA, from May 21-25.

 

1999

44. R. Gauvin, E. Lifshin, (1999), “On the Phi-Ro-Z Curves of Heterogeneous Materials”, Microscopy & Microanalysis, Vol. 5, Supp. 2, pp. 578 – 579. Paper presented at the conference Microscopy & Microanalysis 99 which was held in Portland, Oregon, USA, from August 1-5.

 

43. R. Gauvin, (1999) “The Computation of the Skirt in VP-SEM or ESEM with Monte Carlo Simulations”, Vol. 5, Supp. 2, pp. 296 – 297. Paper presented at the conference Microscopy & Microanalysis 99 which was held in Portland, Oregon, USA, from August 1-5.

 

42. R. Gauvin, P. Hovington, (1999) “On the Microanalysis of Small Precipitates at Low Voltage with a FE-SEM Low Voltage”, Vol. 5, Supp. 2, pp. 308 – 309. Paper presented at the conference Microscopy & Microanalysis 99 which was held in Portland, Oregon, USA, from August 1-5.

 

41. R. Gauvin, P. Hovington, (1999) “On the Contrast of Precipitates Observed with a FE-SEM”, Vol. 5, Supp. 2, pp. 316 – 317. Paper presented at the conference Microscopy & Microanalysis 99 which was held in Portland, Oregon, USA, from August 1-5.

 

40. E. Lifshin, A. Linsebigler and  R. Gauvin, (1999) “Precision in X-Ray Data Computed by Monte Carlo”, Vol. 5, Supp. 2, pp. 86 – 87. Paper presented at the conference Microscopy & Microanalysis 99 which was held in Portland, Oregon, USA, from August 1-5.

 

39. R. Gauvin and E. Lifshin (1999), “Simulation of X-Ray Emission from Rough Surfaces”, Proceedings of the 6th European Workshop on Modern Developments and Applications in Microbeam Analysis (EMAS’99), p. 74. This conference was held in Konstanz, Germany from May 3-7.

 

1998

38. R. Gauvin, (1998) “X-Ray Microanalysis of Porous Materials: New Results”, Vol. 4, Supp. 2, pp. 206 – 207. Paper presented at the conference Microscopy & Microanalysis 98 which was held in Atlanta, Georgia, USA, from July 12-16.

 

37. E. Lifshin, L. A. Peluso and R. Gauvin, (1998) “The Role of Monte Carlo Calculations in Quantitative Analysis”, Vol. 4, Supp. 2, pp. 232 – 233. Paper presented at the conference Microscopy & Microanalysis 98 which was held in Atlanta, Georgia, USA, from July 12-16.

 

36. R. Gauvin and S. Yue (1998), “Characterization of NbC precipitates in Steels using a High Resolution Field Emission Gun Scanning Electron Microscope”, Proceedings of the 25th annual conference of the Microscopical Society of Canada, pp. 71-22. This conference was held in Montréal, Québec, Canada from May 27-29.

 

35. P. Wanjara, R.A.L. Drew, R. Gauvin and S. Yue (1998), “Interfacial Examination of Titanium Based Composites Using Field Emission Scanning Electron Microscopy”, Proceedings of the 25th annual conference of the Microscopical Society of Canada, pp. 11-12. This conference was held in Montréal, Québec, Canada from May 27-29.

 

34. V. Fortin and R. Gauvin (1998), “Field Emission Microscopy for Micro-Electronic Process Development”, Proceedings of the 25th annual conference of the Microscopical Society of Canada, pp. 17-18. This conference was held in Montréal, Québec, Canada from May 27-29.

 

33. P. Hovington, D. Drouin, R. Gauvin and D.C. Joy (1998), “Quantification and Interpretation of FESEM Collected Data using the CASINO Monte Carlo Program”, Proceedings of the 25th annual conference of the Microscopical Society of Canada, pp. 19-20. This conference was held in Montréal, Québec, Canada from May 27-29.

 

32. R. Gauvin (1998), “The Determination of Surface Segregation using X-Ray Microanalysis in the SEM and Monte Carlo Simulations”, Proceedings of the 25th annual conference of the Microscopical Society of Canada, pp. 21-22. This conference was held in Montréal, Québec, Canada from May 27-29.

 

31. D. Drouin, J. Beauvais and R. Gauvin (1998), “The use of EBIC Technique to Characterize Variations in Schottky Barrier Height in Semiconductors Devices”, Proceedings of the 25th annual conference of the Microscopical Society of Canada, pp. 61-62. This conference was held in Montréal, Québec, Canada from May 27-29.

 

30. D. Drouin, P. Hovington, R. Gauvin and J. Beauvais (1998), “Investigation of Sub-Micron Buried Metal Line in VLSI Devices using a Standard SEM”, Proceedings of the 25th annual conference of the Microscopical Society of Canada, pp. 63-64. This conference was held in Montréal, Québec, Canada from May 27-29.

 

29. C. Ayotte, R. Gauvin and M. Brouillette (1998), “Fabrication of TiAl by Mechanical Allowing, SHS and Shock Wave Compaction”, Proceedings of the 25th annual conference of the Microscopical Society of Canada, pp. 67-68. This conference was held in Montréal, Québec, Canada from May 27-29.

 

1997

28. R. Gauvin and S. Yue (1997), “The observation of NbC precipitates in steel in the nanometer range using a field emission gun scanning electron microscope”, Microscopy & Microanalysis, Vol. 3, Supp. 2, pp. 1243-1244. Paper presented at the conference Microscopy & Microanalysis '97 which was held in Cleveland, Ohio, USA, from August 10-14.

 

27. R. Gauvin, P. Wanjara, R. A. L. Drew and S. Yue (1997), “Characterization of the interface in a TiC reinforced Ti-6%Al-4%V composite using Monte Carlo simulations FEGSEM”, Microscopy & Microanalysis, Vol. 3, Supp. 2, pp. 527-528. Paper presented at the conference Microscopy & Microanalysis '97 which was held in Cleveland, Ohio, USA, from August 10-14.

 

26. R. Gauvin, M. Caron, V. Fortin and J.F. Currie (1997), “Characterization of Multilayered Structures using a FEGSEM and X-Ray Microanalysis”, Microscopy & Microanalysis, Vol. 3, Supp. 2, pp. 463-464. Paper presented at the conference Microscopy & Microanalysis '97 which was held in Cleveland, Ohio, USA, from August 10-14.

 

25. M. Kandah, J.-L. Meunier and R. Gauvin (1997), “Vacuum Arc Cathode Spot Characterization on Graphite Materials using FEGSEM”, Microscopy & Microanalysis, Vol. 3, Supp. 2, pp. 1225-1226. Paper presented at the conference Microscopy & Microanalysis '97 which was held in Cleveland, Ohio, USA, from August 10-14.

 

24. D. Drouin, J. Beauvais and R. Gauvin (1997), “Using EBIC Technique to Characterize Changes in Schottky Barrier Height”, Microscopy & Microanalysis, Vol. 3, Supp. 2, pp. 501-502. Paper presented at the conference Microscopy & Microanalysis '97 which was held in Cleveland, Ohio, USA, from August 10-14.

 

23. P. Hovington, D. Drouin, R. Gauvin and D. C. Joy (1997), “Parametrization of the Range of Electrons at Low Energy Using the CASINO Monte Carlo Program”, Microscopy & Microanalysis, Vol. 3, Supp. 2, pp. 885-886. Paper presented at the conference Microscopy & Microanalysis '97 which was held in Cleveland, Ohio, USA, from August 10-14.

 

1996

22. R. Gauvin, D. Drouin and P. Hovington (1996), “Energy Filtered Electron Backscattering Images of 10 nm NbC and AlN Precipitates in Steels Computed by Monte Carlo Simulations”, Microscopy and Microanalysis 1996, pp. 150-151. Paper presented at the conference Microscopy & Microanalysis 1996 which was held in Minneapolis, Minnesota, from August 11-15.

 

21. R. Gauvin, M. Caron, P. Hovington, D. Drouin, G. Gagnon and J.F. Currie (1996), “The Determination of Thickness and Composition of Multilayered Thin Films in the SEM by X-Ray Microanalysis with Monte Carlo Simulations”, Microscopy and Microanalysis 1996, pp. 494-495. Paper presented at the conference Microscopy & Microanalysis 1996 which was held in Minneapolis, Minnesota, from August 11-15.

 

20. D. Drouin, R. Gauvin, J. Beauvais, P. Hovington and D.C. Joy (1996), “Characterization of Schottky Depletion Zone Using EBIC Imaging”, Microscopy and Microanalysis 1996, pp. 152-153. Paper presented at the conference Microscopy & Microanalysis 1996 which was held in Minneapolis, Minnesota, from August 11-15.

 

19. M. Caron, G. Gagnon, R. Gauvin, P. Hovington, D. Drouin, J.F. Currie, Y. Tremblay, L. Ouellet, M. Bigerger and F. Wong (1996), “An Iterative Procedure Based on Monte Carlo Simulation to Determine the Thickness and Composition of VLSI Metallization”, Proceedings Thirteenth International VLSI Multilevel Interconnection Conference (VMIC), pp. 227-229.

 

18. R. Gauvin, D. Drouin and P. Hovington (1996), “Monte Carlo Simulations of Energy Filtered Electron Backscattering Images”, Scanning, Vol. 18, No. 3, pp. 80-81. Paper presented at the conference SCANNING 96 which was held in Monterey, CA, USA, from April 10-12.

 

17. R. Gauvin, M. Caron, D. Drouin, P. Hovington, G. Gagnon and J.F. Currie (1996), “The Use of Monte Carlo Simulations to Determine the Thickness and Composition of Multilayered Thin Films in the SEM”, Scanning, Vol. 18, No. 3, p. 80. Paper presented at the conference SCANNING 96 which was held in Monterey, CA, USA, from April 10-12.

 

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