CIASEM 2017 (Interamerican Congress of Microscopy)

Varadero Beach, Cuba

September 25 to 29, 2017

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Prof. Gauvin was an Invited Speaker at the Symposium of Instrumentation and Analysis with the talk: Quantitative X-Ray Microanalysis and Imaging at High Spatial Resolution in the Field Emission Scanning electron Microscope.

       Paper : R. Gauvin, N. Brodusch, H. Demers (2017), “Electron Microscopy in the FE-SEM, What’s next?”, 

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Microscopy and Microanalysis 2017

Saint-Louis, USA

August 6-10

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Presentations:

Invited Paper : H. Demers, N. Brodusch, R. Gauvin (2017), “The Performances of the SU-9000 in Imaging and EELS”, Invited Speaker

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Presented Papers :

P Hovington, V Timoshevskii, S Bessette, S Burgess, P Statham, R. Gauvin, K. Zaghib (2017), "On the Detection Limits of Li K X-rays Using Windowless Energy Dispersive Spectrometer (EDS)", Microscopy and Microanalysis, 23, S1, pp. 2024-2025. 

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 H. Demers, N. Brodusch and R. Gauvin (2017), "Low Accelerating Voltage Scanning Transmitted Electron Microscope: Imaging, Diffraction, X-ray Microanalysis, and Electron Energy-Loss Spectroscopy at the Nanoscale", Microscopy & Microanalysis, 23, S1, pp. 528-529. 

 

S. Bessette, P. Hovington, C. Kim, R. Gauvin, H. Demers and K. Zaghib. (2017). Development of Quantitative Techniques with Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for Li Characterization in High Energy Batteries. Microscopy & Microanalysis, 23, S1, pp. 2088-2089 

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H. Demers, N. Brodusch and R. Gauvin (2017),  "High Spatial Resolution Spectroscopy in a FE-SEM: X-ray Microanalysis and Electron Energy-Loss Spectroscopy", Microscopy & Microanalysis, 23, S1, pp. 1044-1045.

P. Kikongi, H. Demers, R. Gauvin, R. Gosselin and N. Braidy (2017), "Mapping Data with  Overlapped Spectral Features", Microscopy & Microanalysis, 23, S1, pp. 217-218. 

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C. Teng, H. Demers, N. Brodusch and R Gauvin (2017), "The f-ratio Quantification Method for X-ray Microanalysis with a Field Emission SEM Applied to Multi-Elements Specimen", Microscopy & Microanalysis, 23, S1, pp. 1046-1047. 

 

H. Demers, R. Gauvin, P. Pinard and S. Richter (2017), "Open Source Software for Quantitative X-ray Microanalysis: openMicroanalysis",  Microacopy & Microanalysis, 23, S1, pp. 234-235

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Y. Yuan, H. Demers and R Gauvin (2017), "The Fluorescence Correction of Multilayer Materials for Quantitative X-ray Microanalysis", Microscopy and Microanalysis, 23, S1 pp. 218-219.

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N. Brodusch, H. Demers and R. Gauvin (2017), "Quantification of Thin Specimens in a Scanning Transmission Electron Microscope at Low Accelerating Voltage using the f-ratio Method",  Microscopy & Microanalysis, 23, S1, pp. 236-237. 

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NN17 Nanotechnology Conference

Thessaloniki, Greece

July 2-7

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Invited Paper : R. Gauvin, N. Brodusch, H. Demers (2017), “Electron Microscopy in the FE-SEM, What’s next?”

13th International Conference on Diffusion in Solids and Liquids

Vienna, Austria

June 27 - 29

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Presented paper : R. Gauvin, N. Brodusch and H. Demers (2017), "Characterization of Solid State Diffusion with High Resolution Scanning Electron Microscopy", Book of Abstract of DSL2017, p. 39.

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EMAS 2017

Konstanz,  Germany,

May 7 - 11

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H. Demers, P. T. Pinard, S. Ritcher and R. Gauvin (2017), "Open source Software for Quantitative X-Ray Microanalysis: OPENMICROANALYSIS",  Proceedings of EMAS 2017 and IUMAS-7 Meeting, pp. 351-352. 

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R. Gauvin and S. Rudsinsky (2017), "A universal equation for computing beam broadening", Proceedings of EMAS 2017 and IUMAS-5 Meeting, pp. 44 - 45. 

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H. Demers, C. M. MacRae, N.C. Wilson, P. Hovington, V. Timoshevskii, R. Gauvin and K. Zaghib (2017), "Determination of soft X-Ray Emission Spectroscopy Parameters using Experimental Data for Quantitative Microanalysis", Proceedings of EMAS 2017 and IUMAS-7 Meeting, pp. 349-350. 

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R. Gauvin, N. Brodusch and H. Demers (2017), "Characterisation of Nanomaterials at High Spatial Resolution in the electron Microscope, What is Next?", Proceeding of EMAS 2017 and IUMAS-7 Meeting, pp. 376-377. 

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44th Annual Meeting of the Microscopical Society of Canada

 

Montreal, Canada

May 9 - 11

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Maryam Golozar, P. Hovington, M. Lagacé, P. Bouchard, R. Gauvin, H. Demers and K. Zaghib (2017), "In-situ study of Li metal dendrite in battery applications", Proceedings of the SMC 44th Annual Meeting, pp. 37-38. 

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P. Hovington, M. Lagacé, V. Timoshevskii, S. Bessette, M. Golozar, H. Demers, R. Gauvin and K. Zaghib (2017), "The need and the challenges of material characterization in the development of batteries", . Proceedings of the 44th MSC Annual Meeting, pp. 39-40. 

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C. Teng, H. Demers, N. Brodusch and R. Gauvin (2017), "The f-ratio quantification method for x-ray microanalysis with a field emission SEM applied to multi-elements specimen", Proceedings of the 44th MSC Annual Meeting, pp. 5-6. 

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Y. Yuan, H. Demers, and R. Gauvin (2017), "The fluorescence correction of multilayer materials for quantitative x-ray microanalysis", Proceedings of the SMC 44th Annual Meeting, pp. 40-41. 

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J. Y. Verde Gómez, I. Zeferino González, N. Brodusch and R. Gauvin (2017), "State of the art study of doped-carbon nanostructures using EELS and nano diffraction in a scanning electron microscope in low voltage transmission mode", Proceedings of the 44th SMC Annual Meeting, pp. 3-4. 

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S. Imbriglio, N. Brodusch, R. Gauvin and R.R Chromik (2017), "Investigation of metal/ceramic interfaces created by cold spray". Proceedings of the 44th Annual SMC Meeting, pp. 18-19. 

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Q. Stoyel and R. Gauvin (2017), "Evaluation of core-hole approximation for simulations of EELS spectra", Proceedings of the 44th MSC Annual Meeting, pp. 6-7. 

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S. Bessette, P. Hovington, C. Kim, R. Gauvin, H. Demers and K. Zaghib (2017) "Optimization of secondary ion mass spectrometry quantification for high concentration compounds", Proceedings of the 44th Annual SMC Meeting, pp. 25 - 26. 

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2017 MRS Spring Meeting

Phoenix, USA

April 3-7

 

F. Voisard, W. Bin, M. L. Trudeau, G. P. Demopoulos and R. Gauvin (2017), "Transmission Electron Microscopy Beam Induced Damage on Lithium Iron Silicates", Proceedings of the Spring 2018 MRS Meeting. 

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14th Biennial Australian Microbeam Analysis Symposium

Brisbane, Australia

February 6-10

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 Invited Paper : R. Gauvin, N. Brodusch, H. Demers (2017), “Electron Microscopy with High Spatial Resolution in the FE-SEM, What’s next?”

Presented Paper : R. Gauvin, N. Brodusch, H. Demers, F. Voizard, G. P. Demopoulos, M. L. Trudeau and K. Zaghib (2017), "Lithium Detection in the Electron Microscope", Proceedings of the AMAS 2017 Conference, p 56. 

Workshop : Invited Speaker in the short course “Monte Carlo simulations in electron microscopy”