Invited Papers Presented in Scientific Meetings with Refereed Proceedings

(2004-2019)

 
Go directly to 1997-2003
2019

 

132. R. Gauvin and N. Brodusch (2019), “Analytical STEM at 30 keV”, Invited Speaker, 19th  New Zealand Conference on Microscopy, Hamilton, New Zealand, November 11 – 14.

131. R. Gauvin and N. Brodusch (2019), “Analytical STEM at 30 keV”, Invited Speaker, XV Inter- American Congress of Microscopy (CIASEM15), Buenos Aieres, Argentina, October 1 – 4.

130. R. Gauvin and N. Brodusch (2019), “Analytical STEM at 30 keV”, Invited Speaker at the Microscience Microscopy Congress (mmc2019), Manchester, England, July 1- 4.

129. R. Gauvin and N. Brodusch (2019), “Electron energy Loss spectroscopy at 30 keV”, Invited Speaker at the Fifth Conference on Frontiers of Aberration Corrected Electron Microscopy (PICO 2019), Kasteel Vaalsbroek, The Neetherlands, May 6-10.

128. R. Gauvin and N. Brodusch (2019), “Analytical STEM at 30 keV”, Invited Speaker at the AnalytiX Conference, Singapore, April 12- 14.

127. 127. R. Gauvin and N. Brodusch (2019), “Analytical STEM at 30 keV”, Invited Speaker at the meeting of the Australian Microbeam Analysis Society (AMAS-XV), Melbourne, Australia, February 11- 15.

2018

126. R. Gauvin and N. Brodusch (2018), “Specimen Preparation for Analytical Electron Microscopy from 1 to 30 keV”, Invited Speaker at the Annual Meeting of the Groupement National de Microscopie Electronique en Balayage (GN-MEBA), Paris, France, December 6 - 7, 2018.

 

125. R. Gauvin and N. Brodusch (2018), “Analytical STEM at 30 keV”, Keynote Speaker, 8th Nano Science and Technology Conference, October 24 -26, Berlin, Germany, (Declined).

 

124. R. Gauvin and N. Brodusch (2018), “Analytical STEM at 30 keV, EDS, EELS and CBED at the Nanoscale”, Session Chair at the 19th International Microscopy Congress, Sydney, Australia, September 9 - 14.

 

123. R. Gauvin, N. Brodusch, H. Demers (2018), “Low Voltage Analytical Possibilities in a Scanning Electron Microscope in STEM Mode at 30 kV: EDS, EELS and CBED at the Nanoscale”, Microscopy and Microanalysis 24 (S1), 2036-2037. Invited Speaker at the Microscopy & Microanalysis Conference, Baltimore, MA, USA, August 5 - 9.

 

122. R. Gauvin, H.Demers and N. Brodusch (2018), “The Joy of Nanoscale Imaging and Spectroscopy in a Low Accelerating Voltage Scanning Transmitted Electron Microscope”, Microscopy and Microanalysis, 24, (S1), pp. 640-641. Invited Speaker at the Microscopy & Microanalysis Conference, Baltimore, MA, USA, August 5 - 9.

 

121. R. Gauvin (2018), “My Joy of Research in SEM”, Microscopy & Microanalysis, 24, (S1), pp. 602-603.  Session Chair at  Microscopy & Microanalysis 2017, Baltimore, MD, USA, August 5 - 9.

 

120. R. Gauvin and N. Brodusch (2018), “Analytical STEM at 30 keV”, Keynote Speaker, 39th Annual Conference of the Electron Microscopy society of India, July 18 -20, Bhubaneswar, India.

2017

 

119. R. Gauvin, N. Brodusch, H. Demers (2017), “Electron Microscopy in the FE-SEM, What’s next?”, Invited Speaker, XIV Inter-American Congress of Microscopy (CIASEM14), Varadero, Cuba, September 27 – 29.

118. H. Demers, N. Brodusch, R. Gauvin (2017), “The Performances of the SU-9000 in Imaging and EELS”, Invited Speaker at the Microscopy & Microanalysis Conference, St-Louis, MI, USA, August 6-10.

117. R. Gauvin, N. Brodusch, H. Demers (2017), “Electron Microscopy in the FE-SEM, What’s next?”, Invited Speaker at the NN17 Nanotechnology Conference, Thessaloniki, Greece, July 2-7. 

116. R. Gauvin, N. Brodusch, H. Demers (2017), “Electron Microscopy with High Spatial Resolution in the FE-SEM, What’s next?”, Invited Speaker at the 14th Australian Microbeam Analysis Society Symposium, Brisbane, Australia. February 6 - 10.

2016

115. R. Gauvin, N. Brodusch, H. Demers (2016), “X-Ray Microanalysis and Imaging with High Spatial Resolution in the Field Emission Scanning Electron Microscope”, Invited Speaker, Nano S&T 2016 Conference, Singapore, October 27-28.

 

114. P. Hovington, R. Gauvin and K. Zaghib (2016), "Can we detect Li K X-ray in lithium compounds using energy dispersive spectroscopy?", Invited Speaker, Microscopy & Microanalysis, Colombus, OH, USA, July 24 – 29.

 

113. S. Kaboli, R. Gauvin and P. Burnley (2016), “Deformation Analysis of Forsterite Olivine Using Electron Channeling Contrast”, Invited Speaker, Microscopy & Microanalysis, Colombus, OH, USA, July 24 – 29.

 

112. R. Gauvin, N. Brodusch, H. Demers (2016), “Quantitative X-Ray Microanalysis and Imaging with High Spatial Resolution in the Field Emission Scanning Electron Microscope with Monte Carlo Simulations”, Invited Speaker, APMC11 / MST33 / AAT39 Conference, Phuket, Thailand, May 23-27. The Asia Pacific conference is held every 4 years and is organized by the International Federation of Microscopy Societies.

 

111.  H. Demers, N. Brodusch and R. Gauvin, (2016), “X-Ray Microanalysis in the FE-SEM”, Invited Speaker at European Microbeam Analysis EMAS 2016 - 12th Regional Workshop on Electron Probe Microanalysis of Materials Today - Practical Aspects, Bagnols-sur-Cèze, France,  May 8 – 11.

 

110.  R. Gauvin, N. Brodusch, H. Demers (2016), “X-Ray Microanalysis and Imaging with High Spatial Resolution in the Field Emission Scanning Electron Microscope”, Invited Speaker, AnalytiX 2016 Conference, Dalian, China, April 25-28.

 

109.  R. Gauvin, N. Brodusch, H. Demers (2016), “X-Ray Microanalysis and Imaging with High Spatial Resolution with a State of the Art Field Emission Scanning Electron Microscope”, Invited Speaker at the 24th Australian Conference of Microscopy (ACMM24), Melbourne, Australia, January 31 - February 4.

 

2015

108. R. Gauvin, N. Brodusch and H. Demers (2015), “ Imaging at High Spatial Resolution with BSE in a Field Emission Scanning Electron Microscope”, Invited Speaker at the Annual conference of the Groupement National de Microscopie Electronique en Balayage, GN-MEBA, Paris, France, December 1 – 2.

 

107. R. Gauvin, N. Brodusch, H. Demers (2015), “X-Ray Microanalysis and Imaging with High Spatial Resolution with a State of the Art Field Emission Scanning Electron Microscope”, Invited Speaker at the Energy Materials Nanotechnology (ENM) Fall meeting, Las Vegas, NV, USA, November 16 - 19. (Declined)

 

106. R. Gauvin, N. Brodusch and H. Demers (2015), “Quantitative X-Ray Microanalysis, EBSD and Imaging at High Spatial Resolution in the Transmission Mode of the SEM”, Invited Speaker at the National Institute and Standards (NIST) Workshop on Analytical Transmission Scanning Electron Microscopy, Boulder, CO, USA, September 15 – 16.

 

105. R. Gauvin, N. Brodusch, H. Demers (2015), “Quantitative X-Ray Microanalysis and Imaging at High Spatial Resolution in a Field Emission Scanning Electron Microscope”, Invited Speaker at the XIII Inter-American Congress of Microscopy (CIASEM14), Isla de Margarita, Venezuela, September 21 – 25. (Declined)

 

104. S. Kaboli, H. Demers, R. Gauvin (2015), "Characterization of Hot-Compressed Magnesium Alloys in a Scanning Electron Microscope", Invited Speaker at the 2015 Microscopy and Microanalysis Conference, Portland, OR, USA, August 2-6.

 

103. H. Demers, N. Brodusch and R. Gauvin, (2015), “Quantitative X-Ray Microanalysis in the FE-SEM”, Invited Speaker at the Microscopy & Microanalysis Conference, Portland, OR, USA, August 2 – 6.

 

102.  R. Gauvin, N. Brodusch, H. Demers (2015), “X-Ray Microanalysis and Imaging with High Spatial Resolution in the Field Emission Scanning Electron Microscope”, Invited Speaker, 54th Congress of the Electron microscopy Society of India, Mumbai, India, July 8-10. (Declined)

 

101. R. Gauvin, H. Demers and N. Brodusch (2015), “Imaging and Quantitative X-Ray Microanalysis in the FE-SEM”, Invited Speaker, 42th Annual Meeting of the Microscopical Society of Canada, Hamilton, May 26-29.

 

100. R. Gauvin, N. Brodusch and H. Demers (2015), “Quantitative X-Ray Microanalysis, EBSD and Imaging at High Spatial Resolution in the Transmission Mode of the SEM”, Invited Speaker, 14th EMAS Workshop on modern developments and applications in Microbeam analysis, Portoroz, Slovenia, May 3 – 7.

 

99. R. Gauvin, N. Brodusch and H. Demers (2015), “Quantitative X-Ray Microanalysis in the FE-SEM”, Invited Speaker at the 13th Biennial Australian Microbeam Analysis Society Symposium (AMAS-XIII), Hobart, Australia, February 2 - 5, 2015.

 

2014

98. R. Gauvin, N. Brodusch and H. Demers (2014), “ Quantitative x-ray microanalysis and imaging at high spatial resolution in a field emission scanning electron microscope”, Invited Speaker at the Annual conference of the Groupement National de Microscopie Electronique en Balayage, GN-MEBA, Paris, France, December 1 – 2.

 

97. R. Gauvin, N. Brodusch, H. Demers (2014), “X-Ray Microanalysis in the Transmission electron Microscope”, Session Chair, 18th International Conference of Microscopy, Prague, Czechoslovakia, 8 – 12.

 

96. B. Griffin, D. C. Joy, J. I. Michael and R. Gauvin, (2014), “Evaluation of electron imaging modes in the scanning electron microscope”, Proceedings of the 18th International Conference of Microscopy, paper IT-4-IN-5709. Invited Speaker, Prague, Czechoslovakia, September 8 – 12.

 

95. S. Kaboli, R. Gauvin, (2014), "Electron Channeling Contrast Observations in Deformed Magnesium Alloys"  Invited speaker at the Microscopy & Microanalysis Conference, Hartford, CO, USA. August 3 to 8.

 

94. R. Gauvin, N. Brodusch, H. Demers (2014), “X-Ray Microanalysis and Imaging with High Spatial Resolution with a State of the Art Field Emission Scanning Electron Microscope”, Invited Speaker, 35th Congress of the Indian society of Microscopy, New-Deli, India, July 9-11.

 

93. R. Gauvin, N. Brodusch, H. Demers (2014), “X-Ray Microanalysis and Imaging with High Spatial Resolution with a State of the Art Field Emission Scanning Electron Microscope”, Invited Speaker, AnalytiX 2014 Conference, Dalian, China, April 25-29.

 

92. R. Gauvin, N. Brodusch, H. Demers (2014), “X-Ray Microanalysis and Imaging with High Spatial Resolution with a State of the Art Field Emission Scanning Electron Microscope”, Invited Speaker, 23th  Australian Conference of Microscopy (ACMM23), Adelaide, Australia, February 2 – 6.

 

2013

91. R. Gauvin, N. Brodusch, H. Demers (2013), “Characterization of nanomaterials in the FE-SEM”, Invited Speaker, XII Inter-American Congress of Microscopy (CIASEM13), Cartagena, Colombia, September 24–28.

 

90. R. Gauvin, N. Brodusch, H. Demers (2013), “The Electron Microscope of the Future”, Session Chair, Microscopy & Microanalysis, Indianapolis, OH, USA, August 7-11.

 

89. R. Gauvin (2013), “Quantitative X-Ray Microanalysis in the FE-SEM”, Invited Speaker at the 12th Biennial Australian Microbeam Analysis Society Symposium (AMAS-XII), Sydney, Australia, February 4 - 8, 2013.

 

2012

 

88. R. Gauvin, N. Brodusch, P. Michaud, H. Demers (2013), “The Electron Microscope of the Future”, Invited Speaker, Microscopy & Microanalysis, Indianapolis, OH, USA, August 7-11.

 

87. R. Gauvin (2013), “Quantitative X-Ray Microanalysis in the FE-SEM”, Invited Speaker at the 12th Biennial Australian Microbeam Analysis Society Symposium (AMAS-XII), Sydney, Australia, February 4 - 8, 2013.

 

86. R. Gauvin, N. Brodusch, P. Michaud and M. L. Trudeau (2012), “Imaging and Quantitative X-Ray Microanalysis at high Spatial Resolution in the FE-SEM”, Proceedings of the 2nd Conference of the Society of Microscopy of Argentina (SAMIC 2), pp. 33-34. Invited Speaker, Buenos Aieres, Argentina, April 18 – 20.

 

85. R. Gauvin, N. Brodusch and P. Michaud (2012), “High Resolution Imaging and Quantitative X-Ray Microanalysis in the FE-SEM”, Proceedings of the 10th Asia-Pacific Microscopy Conference (APMC-10), pp. 22 – 23. Invited Speaker, Perth, Australia, February 5 - 9, 2012.

 

2011

84. R. Gauvin (2011), “Fabrication of Nano-Materials with Mechanical Milling”, Invited Speaker at the 1st  Annual World Congress of Nano-S&T that was held in Dalian, China, from October 23 to 26, 2011.

 

83. R. Gauvin, N. Brodusch, P. Michaud and M. L. Trudeau (2011), “X-Ray Microanalysis with High Resolution Imaging in the FE-SEM”, Invited Speaker at the 11th Inter-American Congress on Electron Microscopy (CIASEM 2011), Merida, Mexico, September 25 – 29.

 

82. R. Gauvin and P. Michaud (2011), “Spatial Resolution of X-Ray Images”, Microscopy & Microanalysis, 17 (Supp.2), pp. 888-889. Invited Speaker, Microscopy & Microanalysis, Nashville, TN, USA, August 7-11.

 

81. R. Gauvin, N. Brodusch and P. Michaud (2011), “Determination of Diffusion Coefficients with Quantitative X- Ray Microanalysis at High – Spatial Resolution”, Invited Speaker at the 8th International Conference on Diffusion in Materials (DIMAT) that was held in Dijon, France, from July 3-8. 

 

80. R. Gauvin, N. Brodusch and P. Michaud (2011), “High Resolution Imaging and X-Ray Microanalysis in the FE-SEM”, Proceedings of the 38th Annual Conference of the Microscopical Society of Canada, pp. 30 – 31. Invited Speaker, Ottawa, Canada, June 7 – 10.

 

79. R. Gauvin and P. Michaud (2011), “MC X‐Ray, a Monte Carlo program for quantitative analysis of real materials in the electron microscope”, Proceedings of the 5th conference of International Union of Microbeam Analysis Societies (IUMAS) and ALC’11, p. 77.  Invited Speaker, Seoul, Korea, from May 22 to 27, 2011.

 

78. R. Gauvin (2011), “X-Ray Microanalysis with High spatial Resolution in the Electron Microscope”. Invited Speaker at the 11th conference of AMAS that was held in Canberra, Australia, from February 7 to 11, 2011.

 

2010

77. R. Gauvin, M. L. Trudeau, P. Michaud , A. M. Serventi, R. Veillette, L. Rodrigue and K. Zaghib  (2010), “Advanced Analytical Analysis for Industrial Applications in a HD-2700 Equipped with a SDD X-Ray Detector ”,  Proceedings of the17th International Congress of Microscopy – IMC 17, pp 272-273. Invited Speaker, Rio de Janeiro, Brazil, September 19-24.

 

76. R. Gauvin and P. Michaud (2010), “MC X‐Ray, The Monte Carlo Program for Quantitative Electron Microscopy of Real Materials”, Microscopy & Microanalysis, 16 (Supp.2), pp. 278-279. Invited Speaker at the Microscopy & Microanalysis Conference, Portland, OR, USA, August 1-5.

 

75. R. Gauvin (2010), “Quantitative Microanalysis of Real Materials in Electron Microscopy; Only with Monte Carlo Simulations”, Proceedings of the 21th Australian Conference of Microscopy and Microanalysis (ACMM-21), pp. 26-27. Invited Speaker, Brisbane, Queensland, Australia, July 11-15.

 

74. R. Gauvin (2010), “Quantitative X-Ray Microanalysis with High Resolution Imaging, the Real Benefit of Electron Microscopy”, Proceedings of  the 10th conference of the Mexican Microscopy Association (AMM).  Invited Speaker, Morelia, Mexico, May 23- 27.

 

2009

73. R. Gauvin (2009), “Quantitative X-Ray Microanalysis of Nanomaterials in the FE-TEM and the FE-SEM”, 7th International Symposium on Atomic Level Characterizations for New Materials and Devices ’09, pp. 122 – 123. Invited Speaker at this conference that was held in Maui, Hawaii, USA, from December 6-11.

 

72. R. Gauvin (2009), “Quantitative X-Ray Microanalysis of Nanomaterials in Electron Microscopy”, Proceedings of the 10th Inter-American Congress on Electron Microscopy (CIASEM 2009), p. 17. Invited Speaker at this conference that was held in Rosario City, Argentina, from October 25–28.

 

71. R. Gauvin, P. Michaud and M.L. Trudeau (2009), “What is the Optimal Beam Energy for X-Ray Microanalysis in Electron Microscopy”, Microscopy & Microanalysis, 15 (Supp.2), pp. 422-423. Invited Speaker at the conference Microscopy & Microscopy that was held in Richmond, VA, USA, from July 26-30.

 

70. P. Tetrault-Pinnard, P. Hovington, M. Lagacé and R. Gauvin (2009), “Development of Tools to Increase the Spatial Resolution of EBSD Maps”, Microscopy and Microanalysis, 15 (Supp.2), p. 422-423. Invited Speaker at the conference Microscopy & Microscopy that was held in Richmond, VA, USA, from July 26-30.

 

69. P. Hovington, P. Tetrault-Pinnard, M. Lagacé, D. Thibault, L. Rodrigue, D. Drouin and R. Gauvin (2009), “Evaluation of Strategies to Increase the Spatial Resolution of X-Ray-Mapping in the FESEM of Low Concentration in Sub-Micron microstructures”, Microscopy and Microanalysis, 15 (Supp.2), p. 480-481. Invited Speaker at the conference Microscopy & Microscopy that was held in Richmond, VA, USA, from July 26-30.

 

68. R. Gauvin (2009), “X-Ray Microanalysis in the SEM with Monte Carlo Simulations”, at the Tenth Symposium of the Australian Microbeam Microanalysis Society (AMAS X), pp. 6-7. Invited Speaker in this conference that was held in Adelaide, Australia, from February 9-13.

 

67. R. Gauvin (2008), “X-Ray Microanalysis in the SEM and in the TEM”, Proceedings of the 9th Asia – Pacific Microscopy Conference (APMC-9), pp.42 – 43. Invited Speaker at this conference that was held in Jeju Island, Korea, from November 2-7.

 

2008

66. R. Gauvin (2008), “X-Ray Microanalysis in the SEM and in the TEM”, Proceedings of the 9th Asia – Pacific Microscopy Conference (APMC-9), pp.42 – 43. Invited Speaker at this conference that was held in Jeju Island, Korea, from November 2-7.

 

65. R. Gauvin (2008), “Imaging in the FE-SEM with X-Ray”. Microscopy & Microanalysis, 14 (Supp.2), pp. 1198-1199. Invited Speaker at the conference Microscopy & Microanalysis that was held in Albuquerque, NM, USA, from August 3-7.

 

64. R. Gauvin (2008), “Comparison of the Spatial Resolution of X-Ray Microanalysis in the FE-TEM and in the FE-SEM”, Proceedings of the 4th conference of the International Union of the Microbeam Analysis Society (IUMAS) and the 20th Australian Conference of Microscopy and Microanalysis (ACMM-20), p. 78. Invited Speaker at this conference that was held in Perth, Australia, from February 10-15.

 

 

2007

63. R. Gauvin (2007), “X-Ray Microanalysis in Electron Microscopy”, Proceedings of the 9th InterAmerican Conference of Electron Microscopy (CIASEM), p. 26. Invited Speaker at this conference that was held in Cuzco, Peru, from September 23-28.

 

62. R. Gauvin (2007), “The Effect of Auger Electrons on X-Ray Microanalysis in the Transmission Electron Microscope”, Microscopy & Microanalysis, 13 (Supp.2), pp. 1384-1385. Invited Speaker at the conference Microscopy & Microanalysis that was held in Fort Lauderdale, USA, from August 5-9.

 

61. R. Gauvin (2007), “X-Ray Microanalysis in the Low voltage Field Emission Scanning Electron Microscope”, Proceedings of the Ninth Symposium of the Australian Microbeam Microanalysis Society (AMAS IX), p. 14. Invited Speaker at this conference that was held in Melbourne, Australia, from February 13-16.

 

 

2006

60. R. Gauvin (2006), “Future Trends for Quantitative X-Ray Microanalysis is a Field Emission Scanning Electron Microscope at Low Beam Energies ”, Proceedings of the 16th International Congress of Microscopy,  p. 878. Invited Speaker at this conference that was held in Sapporo, Japan, from September 3-8. 

 

59. R. Gauvin (2006), “Future Trends for Quantitative X-Ray Microanalysis in a FE-SEM”, Microscopy & Microanalysis, 12 (Supp. 2), pp. 840-841. Invited Speaker, Chicago, USA, July 29-August 4. 

 

58. R. Gauvin (2006), “X-Ray Microanalysis in the Low Voltage Field Emission Scanning Electron Microscope and in the VP-SEM”, Proceedings of the 19th Australian Conference on Electron Microscopy (ACEM-19), p. 78. Invited Speaker at this conference that was held in Sydney, Australia, from February 1-6.    

 

 

2005

57. R. Gauvin (2005), “Quantitative X-Ray Microanalysis of Heterogeneous Materials Using Monte Carlo Simulations”, Microscopy & Microanalysis, 11 (Supp. 2), p. 1342-1343. Invited Speaker at the conference Microscopy & Microanalysis that was held in Honolulu, HW, USA, from August 1-5.

 

56. R. Gauvin (2005), “Improved Electron Microscopy with Monte Carlo Simulations”, Microscopy & Microanalysis, 11 (Supp. 2), p. 620-612. Invited Speaker at the conference Microscopy & Microanalysis that was held in Honolulu, HW, USA, from August 1-5.

 

55. K. Robertson, R. Gauvin and J. Finch (2005), “Skirt Corrections in the Variable Pressure SEM”, Microscopy & Microanalysis, 11 (Supp. 2), p. 406-407. Invited Speaker at the conference Microscopy & Microanalysis that was held in Honolulu, HW, USA, from August 1-5.

 

54. R. Gauvin (2005), “On the Development of Phi-Ro-Z Models with Physical Meaning using Monte Carlo Simulations”, Microscopy & Microanalysis, 11 (Supp. 2), p. 1272-1273. Invited Speaker at the conference Microscopy & Microanalysis that was held in Honolulu, HW, USA, from August 1-5.

 

53. R. Gauvin (2005), “Quantitative X-Ray Microanalysis in the Analytical Electron Microscope”, Microscopy & Microanalysis, 11 (Supp. 2), p. 1342-1343. Invited Speaker at the conference Microscopy & Microanalysis that was held in Honolulu, HW, USA, from August 1-5.

 

52. R. Gauvin (2005), “Quantitative X-Ray Microanalysis of Heterogeneous Materials Using Monte Carlo Simulations”, Proceedings of the 9th European Workshop on Modern Developments and Applications in Microbeam Analysis and the 3th Conference of the International Union of the Microbeam Analysis Societies (IUMAS), pp. 217 - 231.  Invited Speaker at this conference that was held in Florence, Italy, from May 22 to 26. 

 

2004

51. R. Gauvin (2004), “X-Ray Microanalysis of Real Materials using Monte Carlo Simulations”, Proceedings of the NIST Workshop on Modeling Electron Transport for Applications in Electron and X-Ray Analysis and Metrology, pp. 42 – 43.  Invited Speaker at this conference that was held in Washington, DC, from November 8-10.

 

50. R. Gauvin (2004), “X-Ray Microanalysis of Heterogeneous Materials with Monte Carlo Simulations”, Proceedings of the International Union for Vacuum Science, Technique and Applications (IUVSTA) Workshop on Monte Carlo Modeling and Electron Scattering, pp.16 - 17. Invited Speaker at this conference that was held in Debrecen, Hungary, from July 4-8. 

 

49. R. Gauvin (2004), “Monte Carlo Simulation of EDS X-Ray Spectra”, Microscopy & Microanalysis, 10, Supp. 2, pp. 922 - 923. Invited Speaker at the conference Microscopy & Microanalysis that was held in Savannah, GO, USA, from August 1-6.       

 

 
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