Prague, Czech Republic
Prof. Raynald Gauvin is chair of the IT-5 Analytical Electron Microscopy session.
Imaging and X-Ray Microanalysis at the Nanoscale with a Cold-Field EMission Scanning ELectron Microscope.
Gauvin R., Brodusch N., Demers H. Woo P (Hitachi High-Technologies Canada Inc., Toronto, Canada)
Microscopy and Microanalysis 2014
Hartford, CT, USA
Ionic Liquid Used for Charge Compensation for High-Resolution Imaging and Analysis in the FE-SEM; N. Brodusch, H. Demers, R. Gauvin; McGill University
High Resolution Imaging in the FIeld Emission Scanning Electron Microscope at Low Accelerating Voltage and with Energy-Filtration of the Electron Signals; R. Gauvin, N. Brodusch, H. Demers; McGill University; P. Woo, Hitachi High-Technologies Canada Inc.
M&M Student Award Transmission Electron Forward Scattered Diffraction and Low Voltage SEM/STEM Characterization of Binder-Free TiO2 Electrodes; MJ Sussman, N. Brodusch, R. Gauvin, GP Demopoulos; McGill University
M&M Student Award Monte Carlo SImulation and Experimental High-Angle Annular Dark Field Tomography; F. Voizard, N. Brodusch, H. Demers, R. Gauvin; McGill University
M&M Student Award Characterization of Rare Earth ELement Ores with High Spatial Resolution Scanning Electron Microscopy; C. Teng, H. Demers, R. Gauvin; McGill University
X-Ray Microanalysis with High Spatial Resolution and High Counts Rate with a State of the Art Field Emission Scanning Electron Microscope; R. Gauvin, N. Brodusch, H. Demers; McGIll University; P. Woo; Hitachi High-Technologies Canada Inc.
M&M Student Award Electron Channeling Contrast Observations in Deformed Magnesium Alloys; S. Kaboli, H. Demers, N. Brodusch, R. Gauvin; McGill University
M&M Student Award Magnetic Domain Structure and Crystal Orientation Revealed by a Forescatter Detector and Electron Backscatter Diffraction; M. Gallaugher, N. Brodusch, R. Gauvin, RR Chromick; McGill University
M&M Student Award; Diatome-Poster Session Award (requires the use of diamond knife ultramicrotomy) Sliding-induced Microstructure of Cold-Sprayed Copper Coating Observed by Electron Channeling Contrast Imaging; Y Zhang, N. Brodusch, JM. Shockley, R. Gauvin, RR. Chromik; McGill University