Microscopy and Microanalysis 2018

Baltimore, Maryland, USA

August 5 - 9 2018

Prof. Gauvin will be session chair of The Joy of Scanning Electron Microscopy, part of the Analytical Science Symposia.

Three of Prof. Gauvin's students will be receiving the M&M Student Scholar Prize (see down below for the papers and the students' names).

Presentations:

INVITED PAPERS

Low Voltage Analytical Possibilities in a Scanning Electron Microscope in Transmission Mode at 30 kV: EDS, EELS and CBED at the Nanoscale; R Gauvin, N Brodusch; McGill University, Canada, H Demers; Hydro-Quebec Research Center, Canada 

The Joy of Nanoscale Imaging and Spectroscopy in a Low Accelerating Voltage Scanning Transmitted Electron Microscope; H Demers; Hydro-Québec, Canada, N Brodusch, R Gauvin; McGill University, Canada, ML Trudeau, K Zaghib; Hydro-Québec, Canada 

PRESENTED PAPERS :

(M&M Student Scholar) Secondary Fluorescence Correction of 3D Heterogeneous Materials for Quantitative X-Ray Microanalysis; Y Yuan; McGill University, Canada, H Demers; Hydro-Quebec’s Research Institute, Canada, R Gauvin; McGill University, Canada 

The Standard-Based f-ratio Quantitative X-Ray Microanalysis Method for a Field Emission SEM; C Teng, H Demers, R Gauvin; McGill University, Canada 

Monte Carlo Simulation of Surface Semi-Spherical Inclusions Using MC X-Ray; S Rudinsky, N Brodusch, R Gauvin; McGill University, Canada 

Exit-Wave Reconstruction and Phase Analysis Using a Hitachi SU9000 FE-SEM; S Rudinsky, R Gauvin; McGill University, Canada 

(M&M Student Scholar) EELS Analysis of Bulk Plasmon Harmonics of Aluminium at 30 keV; F Voisard; Université Mcgill, Canada, N Brodusch; McGill University, Canada, ML Trudeau; Hydro- Québec Research Institute, Canada, H Demers, K Zaghib; Hydro-Quebec, Canada, R Gauvin; McGill University, Canada 

(M&M Student Scholar) Methods for Simulation of Electron Energy Loss Spectra for Low Energy Edges in Battery Materials; Q Stoyel, F Voisard, N Brodusch, GP Demopoulos, R Gauvin; McGill University, Canada 

Annual Conference of the Electron Microscopy Society of India

Bubaneswar, India

July 18-20 2018

Prof. Gauvin is invited as a Keynote Speaker to this conference. 

INVITED PAPER

R. Gauvin and N. Brodusch (2018), “Analytical STEM at 30 keV”, Keynote Speaker, 39th Annual Conference of the Electron Microscopy society of India, July 18 -20, Bhubaneswar, India.

19th International Microscopy Congress

Sydney, Australia

September 9 - 14

Prof. Gauvin is invited as a Session Chair at this conference. 

INVITED PAPER

R. Gauvin and N. Brodusch (2018), “Analytical STEM at 30 keV”, Session Chair at the 19th International Microscopy Congress, Sydney, Australia, September 9 - 14. 

NANO Science and Technology Conference

Berlin, Germany

September 9 - 14

Prof. Gauvin is invited as a Keynote Speaker at this conference. 

INVITED PAPER

R. Gauvin and N. Brodusch (2018), “Analytical STEM at 30 keV”, Keynote Speaker, 8th Nano Science and Technology Conference, October 24 -26, Berlin, Germany.

  

© 2014 by the McGill Electron Microscopy Research Group | Raynald Gauvin.

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