Papers Presented in Scientific Meetings with Refereed Proceedings (2008-2018)

Page 1 (2008-2017)
Page 2 (1996-2007)
Page 3 (1992-1995)
2017

212. P Hovington, V Timoshevskii, S Bessette, S Burgess, P Statham, R. Gauvin, K. Zaghib (2017), "On the Detection Limits of Li K X-rays Using Windowless Energy Dispersive Spectrometer (EDS)", Microscopy and Microanalysis, 23, S1, pp. 2024-2025. Microscopy & Microanalysis 2017, Saint-Louis, USA, August 6 - 10.

 

211. H. Demers, N. Brodusch and R. Gauvin (2017), "Low Accelerating Voltage Scanning Transmitted Electron Microscope: Imaging, Diffraction, X-ray Microanalysis, and Electron Energy-Loss Spectroscopy at the Nanoscale", Microscopy & Microanalysis, 23, S1, pp. 528-529. Microscopy & Microanalysis 2017, Saint-Louis, USA, August 6 - 10.

 

210. S. Bessette, P. Hovington, C. Kim, R. Gauvin, H. Demers and K. Zaghib. (2017). Development of Quantitative Techniques with Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for Li Characterization in High Energy Batteries. Microscopy & Microanalysis, 23, S1, pp. 2088-2089 . Microscopy & Microanalysis 2017, Saint-Louis, USA, August 6 - 10.

 

209. H. Demers, N. Brodusch and R. Gauvin (2017),  "High Spatial Resolution Spectroscopy in a FE-SEM: X-ray Microanalysis and Electron Energy-Loss Spectroscopy", Microscopy & Microanalysis, 23, S1, pp. 1044-1045. Microscopy &

Microanalysis 2017, Saint-Louis, USA, August 6 - 10.

 

208. P. Kikongi, H. Demers, R. Gauvin, R. Gosselin and N. Braidy (2017), "Mapping Data with  Overlapped Spectral Features", Microscopy & Microanalysis, 23, S1, pp. 217-218. Microscopy & Microanalysis 2017, Saint-Louis, USA, August 6 - 10.

 

207. C. Teng, H. Demers, N. Brodusch and R Gauvin (2017), "The f-ratio Quantification Method for X-ray Microanalysis with a Field Emission SEM Applied to Multi-Elements Specimen", Microscopy & Microanalysis, 23, S1, pp. 1046-1047. Microscopy & Microanalysis 2017, Saint-Louis, USA, August 6 - 10.

 

206. H. Demers, R. Gauvin, P. Pinard and S. Richter (2017), "Open Source Software for Quantitative X-ray Microanalysis: openMicroanalysis",  Microacopy & Microanalysis, 23, S1, pp. 234-235. Microscopy & Microanalysis 2017, Saint-Louis, USA, August 6 - 10.

 

205. Y. Yuan, H. Demers and R Gauvin (2017), "The Fluorescence Correction of Multilayer Materials for Quantitative X-ray Microanalysis", Microscopy and Microanalysis, 23, S1 pp. 218-219. Microscopy & Microanalysis 2017, Saint-Louis, USA, August 6 - 10.

 

204. N. Brodusch, H. Demers and R. Gauvin (2017), "Quantification of Thin Specimens in a Scanning Transmission Electron Microscope at Low Accelerating Voltage using the f-ratio Method",  Microscopy & Microanalysis, 23, S1, pp. 236-237. Microscopy & Microanalysis 2017, Saint-Louis, USA, August 6 - 10.

 

203. R. Gauvin, N. Brodusch and H. Demers (2017), "Characterization of Solid State Diffusion with High Resolution Scanning Electron Microscopy", Book of Abstract of DSL2017, p. 39. 13th International Conference on Diffusion in Solids and Liquids, Vienna, Austria, June 27 - 29.

 

202. H. Demers, P. T. Pinard, S. Ritcher and R. Gauvin (2017), "Open source Software for Quantitative X-Ray Microanalysis: OPENMICROANALYSIS",  Proceedings of EMAS 2017 and IUMAS-7 Meeting, pp. 351-352. EMAS 2017 - 15th European Workshop on MODERN DEVELOPMENTS AND APPLICATIONS IN MICROBEAM ANALYSIS and IUMAS-7 Meeting, Konstanz,  Germany, May 7 - 11.

 

201. R. Gauvin and S. Rudsinsky (2017), "A universal equation for computing beam broadening", Proceedings of EMAS 2017 and IUMAS-5 Meeting, pp. 44 - 45. EMAS 2017 - 15th European Workshop on MODERN DEVELOPMENTS AND APPLICATIONS IN MICROBEAM ANALYSIS and IUMAS-7 Meeting, Konstanz, Germany, May 7 - 11.

 

200. H. Demers, C. M. MacRae, N.C. Wilson, P. Hovington, V. Timoshevskii, R. Gauvin and K. Zaghib (2017), "Determination of soft X-Ray Emission Spectroscopy Parameters using Experimental Data for Quantitative Microanalysis", Proceedings of EMAS 2017 and IUMAS-7 Meeting, pp. 349-350. EMAS 2017 - 15th European Workshop on MODERN DEVELOPMENTS AND APPLICATIONS IN MICROBEAM ANALYSIS and IUMAS-7 Meeting, Konstanz,  Germany, May 7 - 11.

 

199. R. Gauvin, N. Brodusch and H. Demers (2017), "Characterisation of Nanomaterials at High Spatial Resolution in the electron Microscope, What is Next?", Proceeding of EMAS 2017 and IUMAS-7 Meeting, pp. 376-377. EMAS 2017 - 15th European Workshop on MODERN DEVELOPMENTS AND APPLICATIONS IN MICROBEAM ANALYSIS and IUMAS-7 Meeting, Konstanz, Germany, May 7 - 11.

 

198. Maryam Golozar, P. Hovington, M. Lagacé, P. Bouchard, R. Gauvin, H. Demers and K. Zaghib (2017), "In-situ study of Li metal dendrite in battery applications", Proceedings of the SMC 44th Annual Meeting, pp. 37-38. 44th Annual Meeting of the Microscopical Society of Canada, Montreal, Canada, May 9 - 11.

 

197. P. Hovington, M. Lagacé, V. Timoshevskii, S. Bessette, M. Golozar, H. Demers, R. Gauvin and K. Zaghib (2017), "The need and the challenges of material characterization in the development of batteries", . Proceedings of the 44th MSC Annual Meeting, pp. 39-40. 44th Annual Meeting of the Microscopical Society of Canada, Montreal, Canada, May 9 - 11.

 

196. C. Teng, H. Demers, N. Brodusch and R. Gauvin (2017), "The f-ratio quantification method for x-ray microanalysis with a field emission SEM applied to multi-elements specimen", Proceedings of the 44th MSC Annual Meeting, pp. 5-6. 44th Annual Meeting of the Microscopical Society of Canada, Montreal, Canada, May 9 - 11.

 

195. Y. Yuan, H. Demers, and R. Gauvin (2017), "The fluorescence correction of multilayer materials for quantitative x-ray microanalysis", Proceedings of the SMC 44th Annual Meeting, pp. 40-41. 44th Annual Meeting of the Microscopical Society of Canada, Montreal, Canada, May 9 - 11.

 

194. J. Y. Verde Gómez, I. Zeferino González, N. Brodusch and R. Gauvin (2017), "State of the art study of doped-carbon nanostructures using EELS and nano diffraction in a scanning electron microscope in low voltage transmission mode", Proceedings of the 44th SMC Annual Meeting, pp. 3-4. 44th Annual Meeting of the Microscopical Society of Canada, Montreal, Canada, May 9 - 11.

 

193. S. Imbriglio, N. Brodusch, R. Gauvin and R.R Chromik (2017), "Investigation of metal/ceramic interfaces created by cold spray". Proceedings of the 44th Annual SMC Meeting, pp. 18-19. 44th annual Meeting of the Microscopical Society of Canada, Montreal, Canada, May 9 - 11.

 

192. Q. Stoyel and R. Gauvin (2017), "Evaluation of core-hole approximation for simulations of EELS spectra", Proceedings of the 44th MSC Annual Meeting, pp. 6-7. 44th Annual Meeting of the Microscopical Society of Canada, Montreal, Canada, May 9 - 11.

 

191. S. Bessette, P. Hovington, C. Kim, R. Gauvin, H. Demers and K. Zaghib (2017) "Optimization of secondary ion mass spectrometry quantification for high concentration compounds", Proceedings of the 44th Annual SMC Meeting, pp. 25 - 26. 44th Annual Meeting of the Microscopical Society of Canada, Montreal, Canada (25-26), May 9 - 11.

 

190. F. Voisard, W. Bin, M. L. Trudeau, G. P. Demopoulos and R. Gauvin (2017), "Transmission Electron Microscopy Beam Induced Damage on Lithium Iron Silicates", Proceedings of the Spring 2018 MRS Meeting. 2017 MRS Spring Meeting, Phoenix, USA, April 3 - 7.

 

189. R. Gauvin, N. Brodusch, H. Demers, F. Voizard, G. P. Demopoulos, M. L. Trudeau and K. Zaghib (2017), "Lithium Detection in the Electron Microscope", Proceedings of the AMAS 2017 Conference, p 56. 14th Biennial Australian Microbeam Analysis Symposium, Brisbane, Australia, February 6 - 10.

 

2016

 

188. H. Demers, N. Brodusch, P. Woo, and R. Gauvin (2016), “Fast and high spatial resolution x-ray microanalysis imaging and quantification in a field emission scanning electron microscope with an annular silicon drift detector”, paper presented at the 24th Australian Conference of Microscopy (ACMM24), Melbourne, Australia, January 31 - February 4.

 

187. F. Voisard, H. Demers, M. Trudeau, G.P. Demopoulos, R. Gauvin and K. Zaghib (2016), “Electron Dose Management for High Angle Annular Dark Field Scanning Transmission Electron Microscope Tomography of Beam Sensitive Materials”, paper presented at the Microscopy & Microanalysis Conference, Columbus, USA, July 24 – 28.  Microscopy and Microanalysis 22 (S3), pp. 1294 – 1295.

 

186. H. Demers, C. M. MacRae, N. C. Wilson, P. Hovington, V. Timoshevskii, R. Gauvin and K. Zaghib (2016), “Determination of soft x-ray emission spectroscopy parameters using experimental data for quantitative microanalysis”, paper presented at the Microscopy & Microanalysis Conference, Columbus, USA, July 24 – 28.  Microscopy and Microanalysis, 22(S3), pp. 408 – 409. 

185. Y. Yu, H. Demers, N. Brodusch and R. Gauvin. “X-ray Emission From Thin Films on a Substrate–Experiments and Simulation”, paper presented at the Microscopy & Microanalysis Conference, Columbus, USA, July 24 – 28.  Microscopy and Microanalysis, 22(S3), pp. 400 – 401.

 

184. H. Demers, N. Brodusch, and R. Gauvin (2016), “High spatial resolution imaging and x-ray microanalysis of nanomaterials in a field emission scanning electron microscope”, paper presented at the conference NANO 2016, Québec, Québec, Canada, August 8 -12. 

183. R. Gauvin, N. Brodusch, H. Demers, G.P. Demopoulos and K. Zaghib (2016), “Lithium detection in the electron microscope”, paper presented at the PRIME Conference 2016 organised by the Electrochemical Society (ECS), Honolulu, Hawaii, USA, October 2 – 7. Meeting Abstract, pp. 203 – 203.

 

182. M. Rasool, T. Feldmann, H. C. Chiu, X. Lu, N. Brodusch, R. Gauvin, K. Zaghib and G. P. Demopoulos (2016), “Reporting on the Unusual Electrochemical Performance of the Low Temperature Orthorhombic Phase of Lithium Iron Silicate”, paper presented at the PRIME Conference 2016 organised by the Electrochemical Society (ECS), Honolulu, Hawaii, USA, October 2 – 7. Meeting Abstract, pp. 934 – 934. 

181. Z. González, R. Gauvin, M. M. Yoshida and Y. V. Gómez (2016), “Carbon Nanotubes Doped with Silicon for Use in the Anode of Lithium Ion Batteries”, paper presented at the PRIME Conference 2016 organised by the Electrochemical Society (ECS), Honolulu, Hawaii, USA, October 2 – 7. Meeting Abstract, pp. 199 – 199.

 

180. R. Gauvin, N. Brodusch, H. Demers (2016), “Characterization of nanomaterials in the FE-SEM”, paper presented at the Nano Science and Technology Conference (Nano S&T 2016), Singapore, October 27-28.

2015

 

179. P. Hovington, M. Lagace, E. Principe, S. Burgess, A. Guerfi, H. Demers, R. Gauvin and K. Zaghib (2015), “Direct and Indirect Observation of Lithium in a Scanning Electron Microscope; Not Only on Pure Li!”, Paper presented at the Microscopy & Microanalysis Conference, Portland, OR, USA, August 2 – 6. Microscopy and Microanalysis, Vol.  21, S3 ,   pp 2357 – 2358.

 

178. N. Brodusch, H. Demers and R. Gauvin (2015), “Dark-Field Imaging based on Post-Processing of Electron Backscatter Diffraction Patterns in a Scanning Electron Microscope Dark-Field Imaging based on Post-Processing of Electron Backscatter Diffraction Patterns in a Scanning Electron Microscope”, Paper presented at the Microscopy & Microanalysis Conference, Portland, OR, USA, August 2 – 6. Microscopy and Microanalysis, Vol.  21, S3 , pp 2031-2032.

 

177. S. Kaboli, H. Demers and R. Gauvin (2015),  “Characterization of Hot-Compressed Magnesium Alloys in a Scanning Electron Microscope”, Paper presented at the Microscopy & Microanalysis Conference, Portland, OR, USA, August 2 – 6. Microscopy and Microanalysis, Vol.  21, S3 , pp 599 – 600.

 

176. N. Brodusch, P. Hovington, H. Demers, R. Gauvin and K. Zaghib (2015),  “Characterization of Advanced Nanomaterials for Lithium Ion Batteries Cathodes Characterization of Advanced Nanomaterials for Lithium Ion Batteries Cathodes”, Paper presented at the Microscopy & Microanalysis Conference, Portland, OR, USA,  August 2 – 6. Microscopy and Microanalysis, Vol.  21, S3 , pp 677 – 678.

 

175. H. Demers, N. Brodusch, P. Woo and R. Gauvin (2015), “Origins and Contrast of the Electron Signals at Low Accelerating Voltage and with Energy-Filtering in the FE-SEM for High Resolution Imaging Origins and Contrast of the Electron Signals at Low Accelerating Voltage and with Energy-Filtering in the FE-SEM for High Resolution Imaging”, Paper presented at the Microscopy & Microanalysis Conference, Portland, OR, USA, August 2 – 6. Microscopy and Microanalysis, Vol.  21, S3 , pp 705 – 706.

 

174. F. Voisard, M. L. Trudeau, G. P. Demopoulos, K. Zaghib and R. Gauvin (2015), “Electron tomography of Iron Lithium silicates”, Late Poster presented at the Microscopy & Microanalysis Conference, Portland, OR, USA, August 2 – 6.

 

173. M. Attarian Shandiz and R. Gauvin (2015), "A New Monte Carlo Program for Detailed simulations of EELS Spectra", 42th Annual Meeting of the Microscopical Society of Canada, Hamilton, May 26-29.

 

172. F. Voisard, M. Trudeau, K. Zaghib and R. Gauvin (2015), "Development of Time Sensitive Electron Tomography through Golden Ratio Acquisition Scheme using Monte Carlo Simulations", 42th Annual Meeting of the Microscopical Society of Canada, Hamilton, May 26-29.

 

171. H. Demers, N. Brodusch and R. Gauvin (2015), "High resolution Imaging and Fast-X-Ray Microanalysis at the Nanoscale with a FE-SEM and a SDD Detector", European Microbeam Analysis Society (EMAS) 2015 - 14th European Workshop on Modern Developments and Applications in Microbeam Analysis,  Portoroz, Slovenia, May 3 – 7, p. 341.

 

2014

 

170. I. Carvajal, G. P. Demopoulos and R. Gauvin (2014), “Engineering via Multiscale Modeling the Light Trapping Response of Random Mesoporous Networks of TiO2-Nanoparticle Based Photoelectrodes”, Oral presentation of a paper to be given at the Fall Meeting of the Materials Research Society, Boston, MA, USA, November 30 – December 5.

 

169. H. Demers, R. Gauvin, N. Brodusch and P. Woo (2014), “Nanoscale Materials Characterization by X-Ray Microanalysis with High Spatial Resolution”, Proceedings of the Conference of Metallurgists, COM2014, paper 8541. Vancouver, British Colombia, Canada, September 28 to October 1rst.

 

168. H. Demers, R. Gauvin, N. Brodusch and P. Woo (2014), “Field Emission Scanning Electron Microscope High Resolution Imaging of Nanoscale Materials”, Proceedings of the Conference of Metallurgists, COM2014, paper 8545. Vancouver, British Colombia, Canada, September 28 to October 1.

 

167. H. Demers, C. Teng, K. Watters, N. Brodusch and R. Gauvin(2014), “Characterization of Rare Earth Element Ores with High Spatial Resolution and High Counts Rate with a Field-Emission Scanning Electron Microscope”, Proceedings of the Conference of Metallurgists, COM2014,paper 8475. Vancouver, British Colombia, Canada, September 28 to October 1.

 

166. R. Gauvin, H. Demers, N. Brodusch and P. Woo (2014), “Nanostructure Imaging with Topographic and Compositional Contrasts in a Cold-Field Emission Scanning Electron Microscope at Low Accelerating Voltage and with Energy-Filtration”, Proceedings of the 18th International Conference of Microscopy, paper IT-4-P-2553. Prague, Czechoslovakia, September 8 –12.

 

165. R. Gauvin, N. Brodusch, H. Demers and P. Woo (2014), “Imaging and X-Ray Microanalysis at the Nanoscale with a Cold-Field Emission Scanning Electron Microscope”, Proceedings of the 18th International Conference of Microscopy, paper IT-5-O-2552. Prague, Czechoslovakia, September 8 – 12.

 

164. H. Demers, N. Brodusch, P. Woo and R. Gauvin (2014), “Toward X-ray Quantitative Microanalysis Maps with an Annular Silicon Drift Detector”, Proceedings of the 18th International Conference of Microscopy, paper IT-5-P-2395. Prague, Czechoslovakia, September 8 – 12.

 

163. R. Gauvin, H. Demers, N. Brodusch and M. L. Trudeau (2014), “Quantitative X-Ray Microanalysis in the Scanning and Transmission Electron Microscopes with the Generalized f-Ratio Method”, Proceedings of the 18th International Conference of Microscopy, paper IT-5-P-2551. Prague, Czechoslovakia, September 8 – 12.

 

162. H. Demers, N. Brodusch, R. Wuhrer, K. Moran, P. Woo and R. Gauvin (2014), “X-ray Quantitative Microanalysis Maps across Interfaces of a Cu-Al Roll Bonded Laminate with an Annular Silicon Drift Detector”,   Microscopy and Microanalysis, 20, S3, pp. 676 – 677. Paper presented at the conference Microscopy & Microscopy that was held in Hartford, CO, USA, from August 2 - 7.

 

161. C. Teng, H. Demers, N. Brodusch, K.E. Waters and R. Gauvin (2014), “Characterization of Rare Earth Element Ores with High Spatial Resolution Scanning Electron Microscopy”,  Microscopy and Microanalysis, 20, S3, pp. 648 – 649. Paper presented at the conference Microscopy & Microscopy that was held in Hartford, CO, USA, from August 2 - 7.

 

160. R. Gauvin, N. Brodusch, H. Demers and P. Woo (2014), “X-Ray Microanalysis with High Spatial Resolution and High Counts Rate with a State of the Art Field Emission Scanning Electron Microscope”, Microscopy and Microanalysis, 20, S3, pp. 428 – 429. Paper presented at the conference Microscopy & Microscopy that was held in Hartford, CO, USA, from August 2 -7.

 

159. M. Attarian Shandiz, F. Salvat and R. Gauvin (2014), “Monte Carlo Simulation of Electron Energy Loss Spectra of Group III-Nitride Nanoscale Semiconductors”,  Microscopy and Microanalysis, 20, S3, pp. 620 – 621. Paper presented at the conference Microscopy & Microscopy that was held in Hartford, CO, USA, from August 2 - 7.

 

158. I. Carvajal, G. P. Demopoulos and R. Gauvin (2014), “Spatial Distribution of Light Scattering and Absorption Interactions with TiO2- Nanoparticles from Monte Carlo and Generalized-Multiparticle-Mie based Simulations for Dye-Sensitized Solar Cell Analysis and Optimization”,  Microscopy and Microanalysis, 20, S3, pp. 548 – 549. Paper presented at the conference Microscopy & Microscopy that was held in Hartford, CO, USA, from August 2 - 7.

 

157. M. Sussman, N. Brodusch, R. Gauvin and G. P. Demopoulos (2014), “Transmission Electron Forward Scattered Diffraction and Low Voltage SEM/STEM Characterization of Binder-Free TiO2 Electrodes”,  Microscopy and Microanalysis, 20, S3, pp. 492 – 493. Paper presented at the conference Microscopy & Microscopy that was held in Hartford, CO, USA, from August 2- 7.

 

156.  Y. Ding, M. Gallaugher, N. Brodusch, R. Gauvin and R. R. Chromik (2014), “Effect of a Coating Induced Residual Stress on Magnetic Domain Structure in Non-Oriented Electrical Steels”,  Microscopy and Microanalysis, 20, S3, pp. 894 – 895. Paper presented at the conference Microscopy & Microscopy that was held in Hartford, CO, USA, from August 2 - 7.

 

155. N. Brodusch, H. Demers and R. Gauvin (2014), “Ionic Liquid Used for Charge Compensation for High-Resolution Imaging and Analysis in the FE-SEM”,  Microscopy and Microanalysis, 20, S3, pp. 38 – 39. Paper presented at the conference Microscopy & Microscopy that was held in Hartford, CO, USA, from August 2 - 7.

 

154. R. Gauvin, N. Brodusch, H. Demers and P. Woo (2014), “High Resolution Imaging in the Field Emission Scanning Electron Microscope at Low Accelerating Voltage and with Energy-Filtration of the Electron Signals”,  Microscopy and Microanalysis, 20, S3, pp. 16 – 17. Paper presented at the conference Microscopy & Microscopy that was held in Hartford, CO, USA, from August 2 - 7.

 

 

2013

153. N. Brodusch, R. Gauvin, H. Demers and M. Trudeau (2013), "High Resolution Imaging and X-Ray Microanalysis in the FE-SEM", Proceedings of the Atomic Level Characterization Conference (ALC'13), Kona, Hawaii, USA, December 2 - 6, Paper 02AN05.

 

152. R. Gauvin, N. Brodusch, G. P. Demopoulos and K. Zaghib (2013), “Characterization of Li2MSiO4 Compounds for Cathodes in Li Based Batteries”, Proceedings of the 224 Conference of Electro Chemical Society (ECS), San Francisco, USA, October 27 – November 1, p. 837.

 

151. R. Gauvin, H. Demers, K. Waters, N. Brodusch (2013), “Characterization of Rare Earth-Bearing Minerals for Processing of the Nechalacho Ore”, Proceedings of the Materials Science & Technology 2013 Conference, Montréal, Canada, October 27 – November 1, pp. 1455 – 1456.

 

150. S. Kaboli, H. Demers, N. Brodusch and R. Gauvin (2013), “Visualization and Quantification of Plastic Strain Induced by Indentation in Polycrystalline Nickel”,  Microscopy and Microanalysis, Vol.  19, Supplement S2, pp. 750 – 751.

 

149. R. Gauvin, D. C. Joy, N. Brodusch, H. Demers and P. Woo (2013),"High resolution imaging and x-ray micro-analysis at high count rate: The supreme achievement in materials characterization",  ibid, pp. 236 - 238.

 

148. H. Demers, N. Brodusch, D. C. Joy, P. Woo and R. Gauvin (2013),  "X-ray quantitative microanalysis with an annular silicon drift detector", ibid, pp. 238 - 240.

 

147. H. Demers, R. Wuhrer, K. Moran and R. Gauvin (2013) "Effect of the probe size and interaction volume on quantitative x-ray maps across interfaces of a Cu-Al roll bonded laminate",  ibid, pp. 260 - 261.

 

146. H. Demers, M. Falke, R. Terborg and R. Gauvin (2013), "Effect of the absorption on the shape of the emitted depth distribution for accurate quantitative microanalysis", ibid, pp. 280 - 281.

 

145. P.T. Pinard, H. Demers, R. Gauvin and S. Richter (2013), “pyMonteCarlo: A Common Programming Interface for Running Identical Simulations using Different Monte Carlo Programs”, ibid, pp. 882 – 823.  

 

144. S. Kaboli, H. Demers, N. Brodusch and R. Gauvin (2013), “Microstructural Characterization of Mg-Al-Ca Alloys Using Ion Milling Surface Preparation Technique”, ibid, pp. 1756 – 1757. 

 

143. M. Attarian Shandiz, F. Salvat and R. Gauvin (2013), “Fine Structure of Core Loss Excitations in EELS by Monte Carlo Simulation”, ibid, pp. 366 – 367.

 

142. N. Brodusch, H. Demers and R. Gauvin (2013), "Nanometre-resolution Kikuchi patterns and dark-field imaging from materials science thin samples with transmission electron forward scatter diraction in the scanningelectron microscope"' In EMAS 2013 - 13th European Workshop, Porto, Portugal, 12th - 16th May, pp. 156 - 157.

 

141. H. Demers and R. Gauvin (2013), "Evaluation of analytical models and Monte Carlo programmes with experimental  depth distribution for quantitative microanalysis",  ibid, pp. 44 - 45.

 

140. H. Demers, P. Michaud and R. Gauvin (2013), "Realistic spectrum modelling which include the x-ray detection process using Monte Carlo simulation",  ibid, pp. 76 - 77.

 

139. R. Gauvin, N. Brodusch and H. Demers (2013), "Experimental determination of the Coster-Kronig transition factors using ratio of Cliff and Lorimer factor obtained at dierent accelerating voltages",  ibid, pp. 122 - 123.

 

2012

138. I. Carvajal, R. Gauvin, G. Demopoulos (2012), “Modeling Light Harvesting of Dye-sensitized Solar Cells via Monte Carlo Simulation of TiO2-nanostructured Film Performance”, Proceedings of the Fall Meeting of the Materials Research Society, Boston, MA, USA, November 25 - 30, Paper Number 1439021.0.

 

137. R. Gauvin, N. Brodusch, H. Demers, P. Michaud, M. L. Trudeau (2012), “High Resolution X-Ray Microanalysis and Imaging with Start of the Art FE-SEM”, Proceedings of the European Microscopy Congress (EMC2012), Paper # 504. Manchester, United Kingdom, September 16 - 21.

 

136. R. Gauvin (2012), “A new method to Validate Ionization Cross-Sections and Koster-Kronig Transition Factors for Quantitative X-Ray Microanalysis”, ibid, paper # P303.

 

135.  R. Gauvin, F. Salvat, M. Shandiz (2012),“Estimation od Detectability Limits in EELS with Monte Carlo Simulations”, ibid, paper # P304. 

 

134. H. Demers, N. Brodusch, K. E. Waters, R. Gauvin (2012), “Characterization of Rare Earth Minerals with Field Emission Scanning Electron Microscopy”, Proceedings of the COM 2012 Rare Earths Symposium held in Niagara Falls, September 30 to October 3, 2012.

 

133. M. Shandiz, F. Salvat, R. Gauvin (2012), “Monte Carlo Simulations of EELS Spectra”, Microscopy and Microanalysis, 18 (Supp.2), p. 998-999. Phoenix, AZ, USA, July 29 - August 3.

 

132. S. Kaboli, J. Su, R. Gauvin (2012), “Comparison of ECCI and EBSD using a FE-SEM”, ibid, p.700-701.

 

131. H. Demers and R. Gauvin (2012), “Evaluation of Analytical Models and Monte Carlo Programs with Experimental φ(ρz) Depth Distribution for Quantitative Microanalysis”, ibid, p.1050-1051.

 

130. P. Michaud, R. Gauvin, H. Demers, N. Brodusch, and M. J.-F. Guinel (2012), “Simulated X-ray Spectra and X-Ray Maps: Evaluation of Models Used in MC X-Ray Monte Carlo Simulation Program and Comparison with experimental Data”, ibid, p.1022-1023.

 

129. P. Tetrault-Pinnard, H. Demers, S. Ritcher and R. Gauvin (2012), “Evaluation of Monte Carlo Codes with for Quantitative X-Ray Microanalysis”, ibid, p. 994-995. 

 

128. R. Gauvin, N. Brodusch, P. Michaud and M. L. Trudeau (2012), “High Resolution Imaging and X-Ray Microanalysis with STEM in the FE-SEM”, ibid, p. 390-391.

 

127. R. Gauvin (2012), “A New Method to Validate Ionization Cross-Sections for the Computation of Cliff-Lorimer K_(AB)

Factors”, ibid, p. 1000-1001.

 

126. R. Gauvin, P. Michaud, H. Demers and M. L. Trudeau (2012), “EDS Spectrum Imaging with Fast Fourier Transforms”, ibid, p. 1008-1009.

 

125. R. Gauvin, H. Demers, P. Michaud, N. Brodusch,  M. l. Trudeau (2012), “Determination of EDS Detection Limits of Nanoparticle Using Monte Carlo Simulations”, ibid, p. 1016 - 1017.

 

124. P. Michaud, R. Gauvin, H. Demers, N. Brodusch, M. J. Guinel (2012), “Simulated X-ray Spectra and X-ray Maps: Evaluation of Models Used in MC X-Ray Monte Carlo Simulation Program and Comparison with Experimental Data”, ibid, p. 1022 - 1023.

 

123. M. J. Guinel, N. Brodusch, R. Gauvin, Y. Verde-Gomez, B. Escobar-Morales (2012), “Electron Microscopy Characterization of Platinum Catalysts Supported on Multi-walled Carbon Nanotubes”, ibid, p. 1316 - 1317.

 

122.H. Demers, K. E. Waters, N. Brodusch, R. Gauvin (2012), “X-Ray Microanalysis of Rare Earth-Bearing Minerals for Processing of the Nechalacho Ore”, ibid, p. 1732 - 1733.

 

121. M. J. Guinel, N. Brodusch, M. Brochu, R. Gauvin (2012), “Electron Microscopy Characterization of Nanosized Strengthening Precipitates in New Generation Aluminum-Lithium Alloys”, ibid, p. 1890 - 1891.

 

120. S. Kaboli, R. Gauvin (2012), “Development of SEM-based techniques to characterize hot-deformation behavior of Magnesium Alloys”, Proceedings of the 9th International Conference on Magnesium Alloys and Their Applications, Vancouver, Canada, July 8 - 12, pp, 40 - 41.

 

119. R. Gauvin, N. Brodusch, M. Brochu, M. L. Trudeau (2012), “High Resolution Microscopy of Al 2199 Alloy”, Proceedings of the 13th International Conference on Aluminum Alloys (ICAA-13), pp. 689 – 696. Pittsburg, PA, USA, June 4 – 8. 

 

118. D. Heard, J. Boselli, R. Gauvin, M. Brochu (2012), “Rapid solidication of a new generation aluminium - Lithium alloy via electrospark deposition”, ibib, pp. 929 - 936.

 

117. R. Gauvin, (2012), “What remains to be done to perform standardless quantitative X-Ray microanalysis?”, Proceedings of the 10th Asia-Pacific Microscopy Conference (APMC-10), pp. 56 – 57. Perth, Australia, February 5 - 9, 2012.

 

2011

 

116.  R. Gauvin (2011), " 60 years after Castaing's thesis; What remains to be done?", Microscopy & Microanalysis, 17 (Supp.2), pp. 550 - 551. Microscopy & Microanalysis, Nashville, TN, USA, August 7-11.

 

115.  R. Gauvin, N. Brodusch, P. Michaud, L. Rodrigue and M. L. Trudeau (2011) "High resolution imaging and x-ray microanalysis in the FE-SEM", Microscopy & Microanalysis, 17 (Supp.2), pp. 596 - 597. Microscopy & Microanalysis, Nashville, TN, USA, August 7-11.

 

2010

114. R. Gauvin, P. Michaud and  M. L. Trudeau (2010), “Quantitative X-Ray Microanalysis of Real Materials in Electron Microscopy with Monte Carlo Simulations  ”,  Proceedings of the17th International Congress of Microscopy – IMC 17. Rio de Janeiro, Brazil, September 19-24.

 

113. R. Gauvin and C. Probst  (2010), “High Resolution Imaging and X-Ray Microanalysis in the FE-SEM”,  Proceedings of the17th International Congress of Microscopy – IMC 17. Rio de Janeiro, Brazil, September 19-24.

 

112. B. J. Griffin, D. C. Joy, J. R. Michael  and R. Gauvin (2010), “Secondary Electron Imaging in SEM, SIM and Variable Pressure SEM”,  Proceedings of the17th International Congress of Microscopy – IMC 17. Rio de Janeiro, Brazil, September 19-24.

 

111. R. Gauvin, P. Michaud and M. L. Trudeau (2010), “Quantitative X-Ray Microanalysis of Real Materials in Electron Microscopy with Monte Carlo Simulations”, Microscopy and Microanalysis, 16 (Supp.2), pp. 256-257. Paper presented at the conference Microscopy & Microscopy that was held in Portland, OR, USA, from August 1-5.

 

110. P. T. Pinard, H. Demers, F. Salvat and R. Gauvin (2010), “An API/GUI for Monte Carlo Simulation of EPMA Spectra Using PENELOPE”, Microscopy and Microanalysis, 16 (Supp.2), pp. 280-281. Paper presented at the conference Microscopy & Microscopy that was held in Portland, OR, USA, from August 1-5. MAS Distinguished Student Award.

 

109. R. Gauvin (2010), “Low Voltage Imaging and X‐Ray Microanalysis in the FE‐SEM”, Microscopy and Microanalysis, 16 (Supp.2), pp. 626-627. Paper presented at the conference Microscopy & Microscopy that was held in Portland, OR, USA, from August 1-5.

 

108.P. T. Pinard, P. Hovington, M. Lagacé, G. F. Vander Voort and R. Gauvin (2010), “Towards A More Quantitative Measurement of the Deformation During Metallographic Specimen Preparation Using EBSD and FIB”, Microscopy and Microanalysis, 16 (Supp.2), pp. 700-701. Paper presented at the conference Microscopy & Microscopy that was held in Portland, OR, USA, from August 1-5.

 

107. R. Gauvin, P. Michaud and M. L. Trudeau (2010), “Development of Spectrum Imaging Strategies for Quantitative X‐Ray

Microanalysis”, Microscopy and Microanalysis, 16 (Supp.2), pp. 928-929. Paper presented at the conference Microscopy & Microscopy that was held in Portland, OR, USA, from August 1-5.

 

106. C. Probst and R. Gauvin (2010), “High Resolution with a Start of the Art Field Emission Scanning Electron Microscope”. Late Breaking Poster presented at the conference Microscopy & Microscopy that was held in Portland, OR, USA, from August 1-5.

 

2009

105. M.L. Trudeau, A.M. Serventi and R. Gauvin (2009), “Fe Distribution in Zr-2.5Nb Pressure Tubes having Variable Deformation Properties”, Microscopy and Microanalysis, 15 (Supp.2), pp. 482-483. Paper presented at the conference Microscopy & Microscopy that was held in Richmond, VA, USA, from July 26-30.

 

104. P. Tetrault-Pinnard, H. Demers, F. Salvat and R. Gauvin (2009), “Visualization and Simulation Optimization of PENELOPE through a Graphical Interface”, Microscopy and Microanalysis, 15 (Supp.2), p. 486-487. Paper presented at the conference Microscopy & Microscopy that was held in Richmond, VA, USA, from July 26-30.

 

103. R. Gauvin and P. Michaud (2009), “MC X-Ray, a New Monte Carlo Program for Quantitative X-Ray Microanalysis of Real Materials”, Microscopy and Microanalysis, 15 (Supp.2), p. 488-489. Paper presented at the conference Microscopy & Microscopy that was held in Richmond, VA, USA, from July 26-30.

 

102. R. Gauvin (2009), “Challenges in Low Voltage Imaging in the FE-SEM”, Microscopy and Microanalysis, 15 (Supp.2), p. 664-665. Paper presented at the conference Microscopy & Microscopy that was held in Richmond, VA, USA, from July 26-30.

 

101. P. Tetrault-Pinnard, P. Hovington, M. Lagacé, G. M. Lucas, G. F. Vander Voort and R. Gauvin (2009), “Quantitative Evaluation of Metallographic Preparation Quality using EBSD”, Microscopy and Microanalysis, 15 (Supp.2), p. 778-779. Paper presented at the conference Microscopy & Microscopy that was held in Richmond, VA, USA, from July 26-30.

 

100. D. Poirier, R. Gauvin and R. A. L. Drew (2009), “Al-Al2O3 nanocomposites produced by mechanical milling”, Proceedings of the Conference Powdermet 2009, pp. 43 – 55. Paper presented at this conference that was held in Las Vegas, NV, from June 28 to July 1.

 

99. R. Gauvin (2009), “X-Ray Microanalysis in the TEM with Monte Carlo Simulations”, at the Tenth Symposium of the Australian Microbeam Microanalysis Society (AMAS X), pp. 20-21. Paper presented at this conference that was held in Adelaide, Australia, from February 9-13.

 

2008

98. R. Gauvin and C. Probst (2008), “Low Voltage Imaging in the SEM”, Proceedings of the 9th Asia – Pacific Microscopy Conference (APMC-9), pp.264 – 265. Invited Speaker at this conference that was held in Jeju Island, Korea, from November 2-7.

 

97. D. Poirier, R. Gauvin and R. Drew (2008), “Characterisation of CNTs-Al Dispersions”, Proceedings of the Conference of Metallurgists 2008, pp.512-513. This conference was held in Winnipeg, Manitoba, Canada, from August 25-28.

 

96. D. Poirier, R. Gauvin and R.A.L. Drew (2008), “Characterization of CNTs-Al dispersions using FE-TEM and FE-SEM”, Microscopy & Microanalysis, 14 (Supp.2), pp. 416-417. Paper presented at the conference Microscopy & Microanalysis that was held in Albuquerque, NM, USA, from August 3-7.

 

95. J. Cocle, S. Yue and R. Gauvin (2008), “The Use of Statistical Approach for Quantitative Strain Analyses with the Intensity Response of EBSD Systems”, Microscopy & Microanalysis, 14 (Supp.2), pp. 916-917. Paper presented at the conference Microscopy & Microanalysis that was held in Albuquerque, NM, USA, from August 3-7.

 

94. P. Tetrault-Pinnard, P. Hovington, H. Demers, M. Lagacé and R. Gauvin (2008), “On The Precision of EDS Analysis with Sample Tilted at 70°”, Microscopy & Microanalysis, 14 (Supp.2), pp. 1100-1101. Paper presented at the conference Microscopy & Microanalysis that was held in Albuquerque, NM, USA, from August 3-7.

 

93. R. Gauvin (2008), “The Spatial Resolution of X-Ray Microanalysis with EDS in the Transmission Electron Microscope”, Microscopy & Microanalysis, 14 (Supp.2), pp. 1162-1163. Paper presented at the conference Microscopy & Microanalysis that was held in Albuquerque, NM, USA, from August 3-7.

 

92. H. Demers and R. Gauvin (2008), “Determination of the Efficiency of Energy Dispersive X-ray Spectrometers with an EDS-CRM Reference Specimen”, Microscopy & Microanalysis, 14 (Supp.2), pp. 1174-1175. Paper presented at the conference Microscopy & Microanalysis that was held in Albuquerque, NM, USA, from August 3-7.

 

91. C. Probst, H. Demers and R. Gauvin (2008), “Determination of the Estimated Resolution of SEM Images”, Microscopy & Microanalysis, 14 (Supp.2), pp. 1202-1203. Paper presented at the conference Microscopy & Microanalysis that was held in Albuquerque, NM, USA, from August 3-7.

 

90. Dominique Poirier, R. A. L. Drew and R. Gauvin (2008), “FE-TEM and FE-SEM Evaluations of Various Dispersion Methods for Carbon Nanotubes”, Proceedings of the 35th Annual Meeting of the Microscopical Society of Canada, pp. 12 - 13. Paper presented at the 35th Annual Meeting of the Microscopical Society of Canada that was held at McGill University, Montréal, Québec, Canada, from May 20 – 23.

 

89. R. Gauvin (2008), “Future Trends for Quantitative X-Ray Microanalysis is a Field Emission Scanning Electron Microscope at Low Beam Energies”, Proceedings of the 35th Annual Meeting of the Microscopical Society of Canada, pp. 20 - 21. Paper presented at the 35th Annual Meeting of the Microscopical Society of Canada that was held at McGill University, Montréal, Québec, Canada, from May 20 – 23.

 

88. H. Demers and R. Gauvin (2008), “Measurement of the Efficiency of Energy Dispersive X-ray Spectrometers with a Reference Specimen”, Proceedings of the 35th Annual Meeting of the Microscopical Society of Canada, pp. 22 - 23. Paper presented at the 35th Annual Meeting of the Microscopical Society of Canada that was held at McGill University, Montréal, Québec, Canada, from May 20 – 23.

 

87. R. Gauvin (2008), “The Effect of Auger Electrons on X-Ray Microanalysis in Electron Microscopy”, Proceedings of the 35th Annual Meeting of the Microscopical Society of Canada, pp. 24 - 25. Paper presented at the 35th Annual Meeting of the Microscopical Society of Canada that was held at McGill University, Montréal, Québec, Canada, from May 20 – 23.

 

86.   J.-F. Le Berre and R. Gauvin (2008), “Skirting and Charging: Two Limitations for the Performance of X-ray Microanalysis with the Variable Pressure or Environmental Scanning Electron Microscope”, Proceedings of the 35th Annual Meeting of the Microscopical Society of Canada, pp. 28 - 29. Paper presented at the 35th Annual Meeting of the Microscopical Society of Canada that was held at McGill University, Montréal, Québec, Canada, from May 20 – 23.

 

85.   J. Cocle, S. Yue and R. Gauvin (2008), “Development of the Intensity Response of EBSD Systems for Quantitative Strain Analysis”, Proceedings of the 35th Annual Meeting of the Microscopical Society of Canada, pp. 36 - 37. Paper presented at the 35th Annual Meeting of the Microscopical Society of Canada that was held at McGill University, Montréal, Québec, Canada, from May 20 – 23.

 

84.   P. Tetrault-Pinnard, P. Hovington, H. Demers, M. Lagacé and R. Gauvin (2008), “Quantitative Analysis of Tilted Sample at 70º to Evaluate the Precision of Simultaneous EBSD-EDS Acquisitions”, Proceedings of the 35th Annual Meeting of the Microscopical Society of Canada, pp. 38 - 39. Paper presented at the 35th Annual Meeting of the Microscopical Society of Canada that was held at McGill University, Montréal, Québec, Canada, from May 20 – 23.

 

83.   D. Poirier, R. Gauvin and R.A.L. Drew (2008), “Improved Monte Carlo Simulations to Model X-ray Microanalysis of Porous Materials”, Proceedings of the 35th Annual Meeting of the Microscopical Society of Canada, pp. 60 - 61. Paper presented at the 35th Annual Meeting of the Microscopical Society of Canada that was held at McGill University, Montréal, Québec, Canada, from May 20 – 23.

 

82.   P. Horny, H. Campbell and R. Gauvin (2008), “Quantitative x-ray microanalysis using a FEG-SEM”, Proceedings of the 35th Annual Meeting of the Microscopical Society of Canada, pp. 66 - 67. Paper presented at the 35th Annual Meeting of the Microscopical Society of Canada that was held at McGill University, Montréal, Québec, Canada, from May 20 – 23.

 

81.   C. Probst, H. Demers and R. Gauvin (2008), “Evolution of the Estimated Resolution of BSE-SEM Images”, Proceedings of the 35th Annual Meeting of the Microscopical Society of Canada, pp. 80 - 81. Paper presented at the 35th Annual Meeting of the Microscopical Society of Canada that was held at McGill University, Montréal, Québec, Canada, from May 20 – 23.

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