NANO Science & Technology Conference

Singapore

October 27-28

INVITED PAPER

  

R. Gauvin, N. Brodusch, H. Demers (2016), “X-Ray Microanalysis and Imaging with High Spatial Resolution in the FE-SEM”, Keynote Speaker.

PRESENTED PAPER

R. Gauvin, N. Brodusch, H. Demers (2016), “Characterization of nanomaterials in the FE-SEM”

PRiME 2016

Honolulu, Hawai, USA

October 2-7, 2016

The McGill Electron Microscopy Research Group will be represented by Pr. Gauvin

Presentations:

"Lithium Detection in the Electron Microscope" by Raynald Gauvin, Nicolas Brodusch, Hendrix Demers, George Demopoulos, Karim Zaghib

 

 “Reporting on the Unusual Electrochemical Performance of the Low Temperature Orthorhombic Phase of Lithium Iron Silicate” by M. Rasool, T. Feldmann, H. C. Chiu, X. Lu, N. Brodusch, R. Gauvin, K. Zaghib and G. P. Demopoulos (2016), , Meeting Abstract, pp. 934 – 934. 

“Carbon Nanotubes Doped with Silicon for Use in the Anode of Lithium Ion Batteries” by Z. González, R. Gauvin, M. M. Yoshida and Y. V. Gómez, Meeting Abstract, pp. 199 – 199. 

The 16th European Microscopy Congress 2016

Lyon, France

August 28 - September 2, 2016

 

The McGill Electron Microscopy Research Group will be represented by Pr. Gauvin

Presentation:

Dark-Field Imaging with Electron Backscatter Diffraction Patterns

 

NANO Conference

Québec, Canada

August 8-12, 2016

 

Presentation:

H. Demers, N. Brodusch, and R. Gauvin (2016), “High spatial resolution imaging and x-ray microanalysis of nanomaterials in a field emission scanning electron microscope”

  

Microscopy and Microanalysis 2016

Columbus, Ohio, USA

July 24-28, 2016

The McGill Electron Microscopy Research Group will be represented by Dr. Hendrix Demers this year.

Presentations:

INVITED PAPERS

Towards Li Quantification at High Spatial Resolution Using EDS; P Hovington, V Timoshevskii; Hydro-Quebec, Canada; S Burgess, P Statham; Oxford Instruments, United Kingdom; H Demers, R Gauvin; McGill University, Canada; K Zaghib; Hydro-Quebec, Canada

 

Deformation Analysis of Forsterite Olivine Using Electron Channeling Contrast Imaging and Electron Backscatter Diffraction; S Kaboli; University of Nevada, Las Vegas; R Guavin; McGill University, Canada; P Burnley; University of Nevada, Las Vegas.

P. Hovington, R. Gauvin and K. Zaghib (2016), "Can we detect Li K X-ray in lithium compounds using EDS?", Invited Speaker.

S. Kaboli, R. Gauvin and P. Burnley (2016), “Deformation Analysis of Forsterite Olivine Using Electron Channeling Contrast”, Invited Speaker.

PRESENTED PAPERS

Electron Dose Management for High Angle Annular Dark Field Scanning Transmission Electron Microscope Tomography of Beam Sensitive Materials; F Voisard, H Demers; McGill University, Canada; M Trudeau; Research Institute D’hydro-Quebec, Canada; GP Demopoulos, R Gauvin; McGill University, Canada; K Zaghib; Research Institute D’Hydro-Quebec, Canada

 

X-Ray Emission From Thin Films on a Substrate - Experiments and Simulation; Y Yuan, H Demers, N Brodusch, R Gauvin; McGill University, Canada

 

Determination of Soft X-Ray Emission Spectroscopy Parameters Using Experimental Data for Quantitative Microanalysis; H Demers; McGill University, Canada; CM MacRae, NC Wilson; CSIRO, Australia; P Hovington, V Timoshevskii; Hydro-Quebec Research Institute, Canada; R Gauvin; McGill University, Canada; K Zaghib; Hydro-Quebec Research Institute, Canada

M. Rasool, T. Feldmann, H. C. Chiu, X. Lu, N. Brodusch, R. Gauvin, K. Zaghib and G. P. Demopoulos (2016), “Reporting on the Unusual Electrochemical Performance of the Low Temperature Orthorhombic Phase of Lithium Iron Silicate”, Meeting Abstract, pp. 934 – 934. 

Asia Pacific Microscopy Conference

Phuket, Thailand

May 23-27

Presentations:

INVITED PAPER

R. Gauvin, N. Brodusch, H. Demers (2016), “Quantitative X-Ray Microanalysis and Imaging with High Spatial Resolution in the FESEM”, Invited Speaker.

European Microbeam Analysis Society

Bagnols-sur-Cèzes, France

May 8 - 12

Presentations:

INVITED PAPER

H. Demers, N. Brodusch and R. Gauvin, (2016), “X-Ray microanalysis and charging”, Invited Speaker. 

Australian Conference of Microscopy

Melbourne, Australia

January 31 - February 4

Presentations:

INVITED PAPER

R. Gauvin, N. Brodusch, H. Demers (2016), “X-Ray Microanalysis and Imaging with High Spatial Resolution with a State of the Art Field Emission Scanning Electron Microscope”, Invited Speaker. 

PRESENTED PAPER

H. Demers, N. Brodusch, P. Woo, and R. Gauvin (2016), “Fast and high spatial resolution x-ray microanalysis imaging and quantification in a field emission scanning electron microscope with an annular silicon drift detector”.

© 2014 by the McGill Electron Microscopy Research Group | Raynald Gauvin.

V. 1.2.7 (June 14, 2019)