McGill Electron Microscopy Research Group
Montréal, Qc, Canada
NANO Science & Technology Conference
Singapore
October 27-28
INVITED PAPER
R. Gauvin, N. Brodusch, H. Demers (2016), “X-Ray Microanalysis and Imaging with High Spatial Resolution in the FE-SEM”, Keynote Speaker.
PRESENTED PAPER
R. Gauvin, N. Brodusch, H. Demers (2016), “Characterization of nanomaterials in the FE-SEM”
PRiME 2016
Honolulu, Hawai, USA
October 2-7, 2016
The McGill Electron Microscopy Research Group will be represented by Pr. Gauvin
Presentations:
"Lithium Detection in the Electron Microscope" by Raynald Gauvin, Nicolas Brodusch, Hendrix Demers, George Demopoulos, Karim Zaghib
“Reporting on the Unusual Electrochemical Performance of the Low Temperature Orthorhombic Phase of Lithium Iron Silicate” by M. Rasool, T. Feldmann, H. C. Chiu, X. Lu, N. Brodusch, R. Gauvin, K. Zaghib and G. P. Demopoulos (2016), , Meeting Abstract, pp. 934 – 934.
“Carbon Nanotubes Doped with Silicon for Use in the Anode of Lithium Ion Batteries” by Z. González, R. Gauvin, M. M. Yoshida and Y. V. Gómez, Meeting Abstract, pp. 199 – 199.
The 16th European Microscopy Congress 2016
Lyon, France
August 28 - September 2, 2016
The McGill Electron Microscopy Research Group will be represented by Pr. Gauvin
Presentation:
Dark-Field Imaging with Electron Backscatter Diffraction Patterns
NANO Conference
Québec, Canada
August 8-12, 2016
Presentation:
H. Demers, N. Brodusch, and R. Gauvin (2016), “High spatial resolution imaging and x-ray microanalysis of nanomaterials in a field emission scanning electron microscope”
Microscopy and Microanalysis 2016
Columbus, Ohio, USA
July 24-28, 2016
The McGill Electron Microscopy Research Group will be represented by Dr. Hendrix Demers this year.
Presentations:
INVITED PAPERS
Towards Li Quantification at High Spatial Resolution Using EDS; P Hovington, V Timoshevskii; Hydro-Quebec, Canada; S Burgess, P Statham; Oxford Instruments, United Kingdom; H Demers, R Gauvin; McGill University, Canada; K Zaghib; Hydro-Quebec, Canada
Deformation Analysis of Forsterite Olivine Using Electron Channeling Contrast Imaging and Electron Backscatter Diffraction; S Kaboli; University of Nevada, Las Vegas; R Guavin; McGill University, Canada; P Burnley; University of Nevada, Las Vegas.
P. Hovington, R. Gauvin and K. Zaghib (2016), "Can we detect Li K X-ray in lithium compounds using EDS?", Invited Speaker.
S. Kaboli, R. Gauvin and P. Burnley (2016), “Deformation Analysis of Forsterite Olivine Using Electron Channeling Contrast”, Invited Speaker.
PRESENTED PAPERS
Electron Dose Management for High Angle Annular Dark Field Scanning Transmission Electron Microscope Tomography of Beam Sensitive Materials; F Voisard, H Demers; McGill University, Canada; M Trudeau; Research Institute D’hydro-Quebec, Canada; GP Demopoulos, R Gauvin; McGill University, Canada; K Zaghib; Research Institute D’Hydro-Quebec, Canada
X-Ray Emission From Thin Films on a Substrate - Experiments and Simulation; Y Yuan, H Demers, N Brodusch, R Gauvin; McGill University, Canada
Determination of Soft X-Ray Emission Spectroscopy Parameters Using Experimental Data for Quantitative Microanalysis; H Demers; McGill University, Canada; CM MacRae, NC Wilson; CSIRO, Australia; P Hovington, V Timoshevskii; Hydro-Quebec Research Institute, Canada; R Gauvin; McGill University, Canada; K Zaghib; Hydro-Quebec Research Institute, Canada
M. Rasool, T. Feldmann, H. C. Chiu, X. Lu, N. Brodusch, R. Gauvin, K. Zaghib and G. P. Demopoulos (2016), “Reporting on the Unusual Electrochemical Performance of the Low Temperature Orthorhombic Phase of Lithium Iron Silicate”, Meeting Abstract, pp. 934 – 934.
Asia Pacific Microscopy Conference
Phuket, Thailand
May 23-27
Presentations:
INVITED PAPER
R. Gauvin, N. Brodusch, H. Demers (2016), “Quantitative X-Ray Microanalysis and Imaging with High Spatial Resolution in the FESEM”, Invited Speaker.
European Microbeam Analysis Society
Bagnols-sur-Cèzes, France
May 8 - 12
Presentations:
INVITED PAPER
H. Demers, N. Brodusch and R. Gauvin, (2016), “X-Ray microanalysis and charging”, Invited Speaker.
Australian Conference of Microscopy
Melbourne, Australia
January 31 - February 4
Presentations:
INVITED PAPER
R. Gauvin, N. Brodusch, H. Demers (2016), “X-Ray Microanalysis and Imaging with High Spatial Resolution with a State of the Art Field Emission Scanning Electron Microscope”, Invited Speaker.
PRESENTED PAPER
H. Demers, N. Brodusch, P. Woo, and R. Gauvin (2016), “Fast and high spatial resolution x-ray microanalysis imaging and quantification in a field emission scanning electron microscope with an annular silicon drift detector”.