Workshop Courses and Seminars

 
Workshop Courses given by Prof. Gauvin

 

Here is a non-exhaustive list:

 

  • Invited Speaker in the short course “Monte Carlo simulations in electron microscopy”, 14th Australian Microbeam Analysis Society Symposium, Brisbane, Australia. February 6 - 10.

  • Invited Speaker in the short course “Monte Carlo simulations in electron microscopy”, 24th Australian Conference on Microscopy and Microanalysis, Melbourne, Australia, January 21-February 4, 2016

  • Invited Speaker in the short course “Monte Carlo simulations in electron microscopy”, 42th Annual Meeting of the Microscopical Society of Canada, Hamilton, ON, Canada, May 26-29, 2015.

  • Invited Speaker in the short course “Monte Carlo simulations in electron microscopy”, 13th Biennial Australian Microbeam Analysis Society Symposium (AMAS-XIII), Hobart, Australia, February 2 - 5, 2015.

  • Invited Speaker to give three lectures in the workshop "Monte Carlo Simulations for Electron Microscopy Workshop". Aachen, Germany, June 10-12, 2014.

  • Invited Speaker in the short course “Monte Carlo simulations in electron microscopy”, 23th  Australian Conference of Microscopy (ACMM23), Adelaide, Australia, February 2 – 6, 2014.

  • Invited Speaker at the Monte Carlo Simulations for Electron Microscopy Workshop, RWTH Aachen University, Germany, from June 10th to 12th, 2014. This workshop was organized by the European Microbeam Analysis Society.

  • Invited Speaker in the short course “Monte Carlo simulations in electron microscopy”, 12th Biennial Australian Microbeam Analysis Society Symposium (AMAS-XII), Sydney, Australia, February 4 - 8, 2013.

  • Invited Speaker in the short course “High-Resolution imaging and x-ray microanalysis in the scanning electron microscope”, Workshop on Scanning Electron Microscopy, University National Autonomus of Mexico, Mexico Ciudad, Mexico, March 1 - 2.

  • Invited Speaker in the short course “Monte Carlo simulations in electron microscopy”, Proceedings of the 10th Asia-Pacific Microscopy Conference (APMC-10), pp. 56 – 57. Perth, Australia, February 5 - 9, 2012.

  • Invited Speaker in the short course “Monte Carlo Simulations in Electron Microscopy” at the 10th Asia-Pacific Microscopy Conference (APMC-10) that was held in Perth, Australia, February 5 to 9, 2012.

  • Invited Speaker in the short course “Monte Carlo Simulations in Electron Microscopy” at the 5th conference of International Union of Microbeam Analysis Societies (IUMAS) and ALC’11.  Seoul, Korea, from May 22 to 27, 2011.

  • Invited Speaker in the short course “SEM Microanalysis” at the 21th Australian Conference of Microscopy and Microanalysis (ACMM-21). Brisbane, Queensland, Australia, July 11-15.

  • Invited Speaker in the short course “SEM Microanalysis” at the Tenth Symposium of the Australian Microbeam Microanalysis Society (AMAS X). Adelaide, Australia, from February 9-13 2009.

  • Invited Speaker in the short course “How to Get the Best of Electron Microscopy with Monte Carlo Simulations” at the 9th Asia – Pacific Microscopy Conference (APMC-9) that was held in Jeju Island, Korea, from November 2-7 2009.

  • Invited Speaker in the short course “Quantitative X-Ray Micro-Analysis” at the 35th Annual Meeting of the Microscopical Society of Canada that was held at McGill University, Montréal, Québec, Canada, from May 20–23 2008.

  • Invited Speaker in the short course “Monte Carlo Simulations in Electron Microscopy” at the 4th conference of the International Union of the Microbeam Analysis Society (IUMAS) and the 20th Australian Conference of Microscopy and Microanalysis (ACMM-20). This conference was held in Perth, Australia, from February 10-15 2008.

  • Invited Speaker in the short course “Quantitative X-Ray Micro-Analysis and Monte Carlo Simulations in Electron Microscopy” at the Ninth Symposium of the Australian Microbeam Microanalysis Society (AMAS IX) that was held in Melbourne, Australia, from February 13-16 2007.

  • Invited Speaker in the short course “Monte Carlo Simulations in Electron Microscopy” at the 19th Australian Conference on Electron Microscopy (ACEM-19). This conference was held in Sydney, Australia, from February 1-6 2006.   

  • Invited Speaker in the short course “X-Ray Microanalysis in the SEM” at the conference Scanning 2003 which was held in San Diego, CA, USA, from May 3-5 2003.

  • Chair and Lecturer at the McGill Microscopy School. This course was held at McGill University, Montréal, Québec, Canada, from May 8 to 12, 2006.

  • Chair and Lecturer at the McGill Microscopy School. This course was held at McGill University, Montréal, Québec, Canada, from May 9 to 13, 2005.

  • Chair and Lecturer at the McGill Microscopy School. This course was held at McGill University, Montréal, Québec, Canada, from May 17 to 21, 2004.

  • Lecturer at the Lehigh Microscopy School in the Quantitative X-Ray Microanalysis. This course was held at Lehigh University, Bethlehem, PA, USA, from June 16 to 20, 2003.

  • Lecturer at the Lehigh Microscopy School in the Quantitative X-Ray Microanalysis. This course was held at Lehigh University, Bethlehem, PA, USA, from June 17 to 21, 2002.

  • Lecturer at the Lehigh Microscopy School in the Quantitative X-Ray Microanalysis course where I replaced the legendary Dr. Joe I. Goldstein after his retirement. This course was held at Lehigh University, Bethlehem, PA, USA, from June 18 to 22, 2001.

  • Invited Speaker in the short course “X-Ray Microanalysis in the SEM” at the conference Scanning 2001 which was held in New York, NY, USA, from May 5 to 7 2001.

  • Invited Speaker in the short course “Introduction to Scanning Electron Microscopy” given at the conference Scanning 2001 which was held in New York, NY, USA, from May 5 to 7 2001. I replaced Dr. David C. Joy.

  • Invited Speaker in the course “X-Ray Microanalysis in the SEM” at the conference Scanning 2000 which was held in San Antonio, TX, USA, from May 9-12 2000.

  • Invited Speaker in the course “X-Ray Microanalysis in the SEM” in the SEM at the conference Scanning 1999 which was held in Chicago, IL, USA, from April 11 to 14 1999.

 

Talks given at Seminars

 

Here is a non-exhaustive list:

  • R. Gauvin (2017) “X-Ray Microanalysis and High Resolution Imaging in the Field Emission Scanning Electron Microscope”, Invited Speaker by Pr. Arvind Agarwal to give a seminar at Florida International University, Florida, USA, March 8.

  • R. Gauvin (2017) “X-Ray Microanalysis and High Resolution Imaging in the Field Emission Scanning Electron Microscope”, Invited Speaker by Pr. Zeng Yi, Shanghai Institute of Ceramics, April 12.

  • R. Gauvin (2017) “X-Ray Microanalysis and High Resolution Imaging in the Field Emission Scanning Electron Microscope”, Invited Speaker by Pr. Gabriela Casanova, University of Uruguay, August 2.

  • R. Gauvin (2016) “X-Ray Microanalysis and High Resolution Imaging in the Field Emission Scanning Electron Microscope”, Invited Speaker by Pr. Ysmael Verde to give a seminar at Cancun Instituto of Technologia, Cancun, Mexico, March 3.

  • R. Gauvin (2016) “X-Ray Microanalysis and High Resolution Imaging in the Field Emission Scanning Electron Microscope”, Invited Speaker by Pr. Zeng Yi to give a seminar at the Shanghai Institute of Ceramics, Shanghai, China, April 14.

  • R. Gauvin (2016) “X-Ray Microanalysis and High Resolution Imaging in the Field Emission Scanning Electron Microscope and Introduction to Monte Carlo Simulations”, Invited Speaker by Dr. Yukihiro Shimogaki, Chair of the Materials Science and Engineering Department, to give a research seminar at  Tokyo University , Tokyo, Japan, July 26.

  • R. Gauvin (2016) “X-Ray Microanalysis and High Resolution Imaging in the Field Emission Scanning Electron Microscope”, Invited Speaker by Pr. Masatochi Kotera to give a seminar at the Osaka Institute of Technology, Osaka, Japan, August 1.

  • R. Gauvin (2016) “X-Ray Microanalysis with Monte Carlo Simulations”, Invited Speaker by Dr. Shin Fujita to give a seminar at Shimadzu Corporation, Kyoto, Japan, August 2.

  • R. Gauvin (2016) “X-Ray Microanalysis and High Resolution Imaging in the Field Emission Scanning Electron Microscope”, Invited Speaker by Prof Dr. Nguyen Phuc Duong (Dr. Duong), Vice Director of International Training Institute for Materials Science (ITIMS) to give a seminar at the Hanoi University of Science and Technology (Dai hoc Bach khoa Ha Noi), Ha Noi, Vietnam, August 9.

  • R. Gauvin (2016) “X-Ray Microanalysis and High Resolution Imaging in the Field Emission Scanning Electron Microscope”, Invited Speaker by Pr. Nguyen Viet Long to give a seminar at Ton Duc Thang University, Ho Chi Minh City, Vietnam, August 17.

  • R. Gauvin (2016) “X-Ray Microanalysis and High Resolution Imaging in the Field Emission Scanning Electron Microscope”, Invited Speaker by Pr. Stephen Pennycook to give a seminar at the University of Singapore, Singapore, October 25.

  • R. Gauvin (2016) “X-Ray Microanalysis and High Resolution Imaging in the Field Emission Scanning Electron Microscope”, Invited Speaker by Pr. Angel Sanz to give a seminar at the Universidad Complutense de Madrid, Madrid, Spain, November 30.

  • R. Gauvin (2015) “X-Ray Microanalysis and High Resolution Imaging in the Field Emission Scanning Electron Microscope”, Invited Speaker by Pr. Kai Chen to give a seminar at Xi'an Jiaotong University, Xi'an, China, July 24.

  • R. Gauvin (2015) “X-Ray Microanalysis and High Resolution Imaging in the Field Emission Scanning Electron Microscope and Introduction to Monte Carlo Simulations”, Invited Speaker by Pr. Prasonk Sricharoenchai  to give a full day seminar at  Chulalongkorn University , Bangkok, Thailande, August 4.

  • R. Gauvin (2015) “X-Ray Microanalysis and High Resolution Imaging in the Field Emission Scanning Electron Microscope”, Invited Speaker by Pr. Zeng Yi to give a seminar at the Shanghai Institute of Ceramics, Shanghai, China, October 16.

  • R. Gauvin (2015) “X-Ray Microanalysis and High Resolution Imaging in the Field Emission Scanning Electron Microscope”, Invited Speaker by Pr. Joanne Etheridge to give a seminar at Monash University, Melbourne, Australia, November 11.

  • R. Gauvin (2014) “X-Ray Microanalysis and High Resolution Imaging in the Field Emission Scanning Electron Microscope”, Invited Speaker by Pr. Angus Wilkinson to give a seminar at the University of Oxford, Oxford, Great Britain, July 31.

  • R. Gauvin (2014)  “X-Ray Microanalysis and High Resolution Imaging in the Field Emission Scanning Electron Microscope”, Invited Speaker by Pr. Grace Burke to give a seminar at the University of Manchester, Manchester, Great Britain, July 21.

  • R. Gauvin (2014)  “X-Ray Microanalysis and High Resolution Imaging in the Field Emission Scanning Electron Microscope”, Invited Speaker by Pr. Doug Perovic to give a seminar at the opening of the Ontario Center for the Characterization of Materials, University of Toronto, Toronto, Canada, July 17.

  • R. Gauvin (2014) “X-Ray Microanalysis and High Resolution Imaging in the Field Emission Scanning Electron Microscope”, Invited Speaker by Dr. Sylvia Ritcher to give a seminar at the RWTH, Aachen, Germany, June 12.

  • R. Gauvin (2014) “X-Ray Microanalysis and High Resolution Imaging in the Field Emission Scanning Electron Microscope”, Invited Speaker by Dr. Zeng Yi to give a seminar at the Shanghai Institute of Ceramics, Shanghai, China, April 25.

  • R. Gauvin (2014) “X-Ray Microanalysis and High Resolution Imaging in the Field Emission Scanning Electron Microscope”, Invited Speaker by Pr. Jean-Louis Monceau to give a seminar at Universite des Antilles et de la Guyane, Pointe a Pitre, Guadeloupe, March 7.

  • R. Gauvin (2013) “X-Ray Microanalysis and High Resolution Imaging in the Field Emission Scanning Electron Microscope”, Invited Speaker by Pr. Maxime Guinel to give a seminar at University of Porto-Rico, Porto-Rico, March 5.

  • R. Gauvin (2013) “X-Ray Microanalysis and High Resolution Imaging in the Field Emission Scanning Electron Microscope”, Invited Speaker by Dr. Xiaodong Han, Chair of the Institute of Microstructure, to give a seminar at the  Beijing University of Technology, Beijing, China, July 23.

  • R. Gauvin (2012) “X-Ray Microanalysis and High Resolution Imaging in the Field Emission Scanning Electron Microscope”, Invited Speaker by Dr. Patrick Desjardins, Chair of Physics Engineering, to give a seminar at Ecole Polytechnique de Montreal, January 23.

  • R. Gauvin (2012) “X-Ray Microanalysis and High Resolution Imaging in the Field Emission Scanning Electron Microscope”, Invited Speaker by Dr. Xiaodong Han, Chair of the Institute of Microstructure, to give a seminar at the  Beijing University of Technology, Beijing, China, July 15.

  • R. Gauvin (2012) “X-Ray Microanalysis and High Resolution Imaging in the Field Emission Scanning Electron Microscope”, Invited Speaker by Dr. Robert Sinclair, Chair Materials Engineering, to give a seminar at Stanford University, Palo-Alto, CA, USA, August 21.

  • R. Gauvin (2011) “X-Ray Microanalysis and High Resolution Imaging in the Field Emission Scanning Electron Microscope”, Invited Speaker by Dr. Yasmel Verde, to give a seminar at the  Instituto Politécnico de Cancun, Cancun, Mexico, March 8.

  • R. Gauvin (2011) “X-Ray Microanalysis and High Resolution Imaging in the Field Emission Scanning Electron Microscope”, Invited Speaker by Dr. Zeng Yi to give a seminar at the Shangai Institute of Ceramics, Shangai, China, October 21.

  • R. Gauvin (2011) “X-Ray Microanalysis and High Resolution Imaging in the Field Emission Scanning Electron Microscope”, Invited Speaker by Dr. Mario Fafard to give a seminar at Université Laval, Québec City, November 25.

  • R. Gauvin (2010) “X-Ray Microanalysis in the Low Voltage Scanning Electron Microscope and in the Field Emission Transmission Electron Microscope with Monte Carlo Simulations”, Invited Speaker by Dr. Gerardo Cabañas, to give a seminar at the  Instituto Politécnico Nacional (IPN), Mexico Ciudad, Mexico, August 17.

  • R. Gauvin (2010) “X-Ray Microanalysis in the Low Voltage Scanning Electron Microscope and in the Field Emission Transmission Electron Microscope with Monte Carlo Simulations”, Invited Speaker by Dr. Jesus Arenas Alatorre to give a seminar at the Universidad Nacional Autonoma de Mexico (UNAM), Mexico Ciudad, Mexico, August 13.

  • R. Gauvin (2010) “X-Ray Microanalysis in the Low Voltage Scanning Electron Microscope and in the Field Emission Transmission Electron Microscope with Monte Carlo Simulations”, Invited Speaker by Dr. Ivan Oliva to give a seminar at the Centro de Investigación y de Estudios Avanzados del Instituto Politécnico Nacional (CINVESTAV), in Merida, Mexico, July 29.

  • R. Gauvin (2010) “X-Ray Microanalysis in the Low Voltage Scanning Electron Microscope and in the Field Emission Transmission Electron Microscope with Monte Carlo Simulations”, Invited Speaker by Dr. Dale Newbury to give a seminar at National Institute of Science and Technology (NIST), Gaithersburg, MD, USA, April 6.

  • R. Gauvin (2009) “X-Ray Microanalysis in the Low Voltage Scanning Electron Microscope and in the Field Emission Transmission Electron Microscope”, Invited Speaker by Dr. Phil Batson to give a seminar at the IBM John Watson Research Center, Yorktown, NY, USA, April 14.

  • R. Gauvin (2008) “La microscopie électronique comme outil de development des matériaux”, Invited Speaker by Dr. Yves Beaulieu to give a seminar at École des Mines de Paris, Palaiseau, France, November 27.

  • R. Gauvin (2008) Invited Speaker by Dr. Francesc Salvat to give a seminar at the University of Barcelona, Barcelona, Spain, July 9.

  • R. Gauvin (2007) “La microscopie électronique comme outil de development des alliages d’aluminium”, Invited Speaker by Dr. Charette to give a seminar at UQAC, Chicoutimi, Québec, Canada, October 11.

  • R. Gauvin (2006), “X-Ray Microanalysis in the Low Voltage Scanning Electron Microscope”, Invited Speaker by Dr. Seiji Isoda to give a seminar at the University of Kyoto, Kyoto, Japan,  August 23.

  • R. Gauvin (2006), “X-Ray Microanalysis in the Low Voltage Scanning Electron Microscope”, Invited Speaker by Dr. Masatoshi Kotera to give a seminar presented at the Osaka Institute of Technology, Osaka, Japan, August 24.

  • R. Gauvin (2006), “X-Ray Microanalysis in the Low Voltage Scanning Electron Microscope”, Invited Speaker by Dr. Tanaka to give a seminar presented at the National Institute of Materials Science (NIMS), Tsubuka, Japan, August 30.

  • R. Gauvin (2006) “Les méthodes de Monte Carlo en microscopie électronique ”, Invited Speaker by Dr. Philippe Jonnard to give a seminar at Université Pierre et Marie Currie, Paris, France, July 7.

  • R. Gauvin (2005) “La microscopie électronique pour characteriser les matériaux”, Invited Speaker by Dr. Christiane Bonnelle to give a seminar at Université Pierre et Marie Currie, Paris, France, July 6.

  • R. Gauvin (2005), “The Contrast of BSE Images Simulated with Monte Carlo”, Invited Speaker by Dr. Giorgio Merli to give a seminar at the Instituto LAMEL, Bologna, Italy, June 1.

  • R. Gauvin (2004), “Monte Carlo Simulations in Electron Microscopy”, Invited Speaker by Dr. John Hunt to give a Seminar at the Gatan Research Center, Pleasanton, Ca, USA, May  12.

  • R. Gauvin (2003) “Monte Carlo Simulations in Electron Microscopy”, Invited Speaker by Dr. Tom Malis to give a Seminar at CANMET, Ottawa , October  7.

  • R. Gauvin (2003) “Materials Characterization with Electron Microscopy”, Invited Speaker by Dr. Daniel Larouche to give a Seminar at Laval University, Québec City, Québec, Canada, February  7.

  • R. Gauvin (1999), “Monte Carlo Simulations in Electron Microscopy”, Invited Speaker by Dr. Bill Davidson to give a Seminar at the Hewlett-Packard Research Center, Palo-Alto, Ca, November  10.

  • R. Gauvin (1999), “X-Ray Microanalysis of Rough Surfaces”, Invited Speaker by Dr. Dale E. Newbury to give a seminar at the National Institute of Science and Technology (NIST), Gaithersburg, MA, USA, October 7.

  • R. Gauvin (1998), “The Contrast of BSE Images Simulated with Monte Carlo”, Invited Speaker by Dr. Giorgio Merli to give a seminar at the Instituto LAMEL, Bologna, Italy, July 21.

  • R. Gauvin (1996), “On the Effect of FSE on X-Ray Emission in the SEM”, Invited Speaker by Dr. Dale E. Newbury to give a seminar at the National Institute of Science and Technology (NIST), Gaithersburg, MA, USA, May 13.

  • R. Gauvin (1996), “Monte Carlo Simulations and X-Ray Microanalysis”, Invited Speaker by Dr. Eric Lifshin to give a seminar at the Corporate R&D Center of General Electric at Schenectady, New York, USA, 10 December 10, 1996.

  • R. Gauvin (1995),  “The use of Monte Carlo Simulations for Metrology Applications”, Invited Speaker by Dr. Jerry Lowney to give a seminar at the National Institute of Science and Technology (NIST), Gaithersburg, MA, USA, July 17, 1995.

  • R. Gauvin (1993), “Factors Affecting Quantitative Microanalysis in the AEM”. Invited Speaker by Dr. Joseph I. Goldstein to give a seminar at Lehigh University, Bethlehem, PA, March 29 1993.

  • R. Gauvin (1991), “X-ray Microanalysis in the TEM and in the SEM”. Invited Speaker by David C. Joy to give a seminar at Tennessee University, March 23 1991.