Conferences 2015

Microscopy and Microanalysis 2015

August 2-6 2015

The McGill Electron Microscopy Research Group was represented by Dr. Hendrix Demers.

Presentations:

INVITED PAPER

Characterization of Hot-Compressed Magnesium Alloys in a Scanning Electron Microscope ; S Kaboli, H Demers, R Gauvin; McGill University

PRESENTED PAPERS

Characterization of Advanced Nanomaterials for Lithium Ion Batteries Cathodes

H Demers, N Brodusch; McGill University; P Hovington; Institut de Recherche d'Hydro Québec (IREQ); R Gauvin; McGill University; K Zaghib;

Institut de Recherche d'Hydro Québec (IREQ)

Origins and Contrast of the Electron Signals at Low Accelerating Voltage and with Energy-Filtering in the FE-SEM for High

Resolution Imaging

H Demers, N Brodusch; Department of Mining and Materials Engineering, McGill University; P Woo; Hitachi High-Technologies Canada Inc; R

Gauvin; Department of Mining and Materials Engineering, McGill University

Direct and Indirect Observation of Lithium in a Scanning Electron Microscope; Not Only on Pure Li!

P Hovington, M Lagacé; Hydro-Quebec; E Principe; Tescan USA; S Burgess; Oxford Instruments NanoAnalysis; A Guerfi; Hydro-Quebec; H

Demers; McGill University; K Zaghib; Hydro-Quebec, R Gauvin; McGill University

High Spatial Resolution Quantification X-ray Microanalysis in a Field Emission Scanning Electron Microscope with a Annular Silicon Drift Detector

H Demers, N Brodusch; McGill University; P Woo; Hitachi High-Technologies Canada Inc; R Gauvin; McGill University

Rotation Axes Analysis of Deformed Magnesium Using Electron Backscatter Diffraction and Rotation Contour Contrast Reconstruction

S Kaboli, H Demers, R Gauvin; McGill University

Characterization of Hot-Compressed Magnesium Alloys in a Scanning Electron Microscope

S. Kaboli, H. Demers and R. Gauvin. Microscopy and Microanalysis, Vol. 21, S3 , pp 599 – 600

Dark-Field Imaging based on Post-Processing of Electron Backscatter Diffraction Patterns in a Scanning Electron Microscope

N. Brodusch, H. Demers and R. Gauvin. Microscopy and Microanalysis, Vol. 21, S3 , pp 2031-2032

May 26-29, 2015

Presentations:

A New Monte Carlo Program for Detailed simulations of EELS Spectra

M. Attarian Shandiz and R. Gauvin

Development of Time Sensitive Electron Tomography through Golden Ratio Acquisition Scheme using Monte Carlo Simulation

F. Voisard, M. Trudeau, K. Zaghib and R. Gauvin

May 3 - 7, 2015

Presentation:

High resolution Imaging and Fast-X-Ray Microanalysis at the Nanoscale with a FE-SEM and a SDD Detector

H. Demers, N. Brodusch and R. Gauvin.