Microscopy and Microanalysis 2015

Portland, Oregon, USA

August 2-6 2015

The McGill Electron Microscopy Research Group was represented by Dr. Hendrix Demers. 

Presentations:

 

INVITED PAPER 

Characterization of Hot-Compressed Magnesium Alloys in a Scanning Electron Microscope ; S Kaboli, H Demers, R Gauvin; McGill University

 PRESENTED PAPERS

Characterization of Advanced Nanomaterials for Lithium Ion Batteries Cathodes

       H Demers, N Brodusch; McGill University; P Hovington; Institut de Recherche d'Hydro Québec (IREQ); R Gauvin; McGill University; K Zaghib;

       Institut de Recherche d'Hydro Québec (IREQ)

Origins and Contrast of the Electron Signals at Low Accelerating Voltage and with Energy-Filtering in the FE-SEM for High

       Resolution Imaging

       H Demers, N Brodusch; Department of Mining and Materials Engineering, McGill University; P Woo; Hitachi High-Technologies Canada Inc; R

       Gauvin; Department of Mining and Materials Engineering, McGill University

 

Direct and Indirect Observation of Lithium in a Scanning Electron Microscope; Not Only on Pure Li!

       P Hovington, M Lagacé; Hydro-Quebec; E Principe; Tescan USA; S Burgess; Oxford Instruments NanoAnalysis; A Guerfi; Hydro-Quebec; H

       Demers; McGill University; K Zaghib; Hydro-Quebec, R Gauvin; McGill University

High Spatial Resolution Quantification X-ray Microanalysis in a Field Emission Scanning Electron Microscope with a Annular Silicon Drift Detector

       H Demers, N Brodusch; McGill University; P Woo; Hitachi High-Technologies Canada Inc; R Gauvin; McGill University

 

Rotation Axes Analysis of Deformed Magnesium Using Electron Backscatter Diffraction and Rotation Contour Contrast Reconstruction

       S Kaboli, H Demers, R Gauvin; McGill University

Characterization of Hot-Compressed Magnesium Alloys in a Scanning Electron Microscope

       S. Kaboli, H. Demers and R. Gauvin. Microscopy and Microanalysis, Vol.  21, S3 , pp 599 – 600

Dark-Field Imaging based on Post-Processing of Electron Backscatter Diffraction Patterns in a Scanning Electron Microscope

       N. Brodusch, H. Demers and R. Gauvin. Microscopy and Microanalysis, Vol.  21, S3 , pp 2031-2032

42nd Annual Meeting of the Microscopical Society of Canada

Hamilton, Canada

May 26-29, 2015

Presentations:

A New Monte Carlo Program for Detailed simulations of EELS Spectra

       M. Attarian Shandiz and R. Gauvin

 

Development of Time Sensitive Electron Tomography through Golden Ratio Acquisition Scheme using Monte Carlo Simulation

       F. Voisard, M. Trudeau, K. Zaghib and R. Gauvin

European Microbeam Analysis Society

Portoroz, Slovenia

May 3 - 7, 2015

Presentation:

High resolution Imaging and Fast-X-Ray Microanalysis at the Nanoscale with a FE-SEM and a SDD Detector 

       H. Demers, N. Brodusch and R. Gauvin.