McGill Electron Microscopy Research Group

Materials' characterization is key to developing more sustainable energies and technologies. McGill Electron Microscopy Research Group proposes several cold-field emission scanning (transmission) electron microscopes. Their high resolutive power makes these instruments ideal to characterize nanomaterials as well as nanometric features in metal and alloys. Their low accelerating voltage capabilities make these tool also very efficient in characterizing biological/life science materials. To accommodate each sample to SEM/STEM characterization, the group owns a wide variety of sample preparation tools including broad ion beam systems and surface preparation tools. In addition, our collaboration with other characterization groups at McGill University, namely the Facility for Electron Microscopy Research (FEMR), McGill Institute for Advanced Materials (MIAM) and McGill Materials Characterization (MMC), grants access to many other characterization tools such as transmission electron microscopes (TEM), X-ray photoelectron spectroscopy (XPS), micro-computed tomography (microCT) and X-ray diffraction (XRD) instruments.