Articles in Referred Publications (1991-2005)

Page 1 (2006-2017)
Page 2 (1991-2005)

35. R. Gauvin (2005), “X-Ray Microanalysis of Real Materials using Monte Carlo Simulations”, Surface and Interface Analysis, 37 (11), pp. 875 – 886.


34. K. Robertson, J. Finch and R. Gauvin (2005), “Application of Charge Contrast Imaging in Mineral Characterization”, Minerals Engineering, 18, pp. 343 - 352. 


33. M. Brochu, H. Demers, R. Drew and R. Gauvin (2005), “Determination of E2 for Nitrides using FE-SEM and the DHL Procedure”, Microscopy & Microanalysis, 11, pp. 1 - 10.  



32. H. Demers and R. Gauvin (2004), “X-Ray Emission from Non-Conductive Specimens”, Microscopy & Microanalysis, 10, pp. 776 - 782.


31. K. Robertson, J. Finch and R. Gauvin (2004), “Charge Contrast Imaging of Gibbsite using the VP-SEM”, Microscopy & Microanalysis, 10, pp. 721 - 732.


30. R. Gauvin, E. Lifshin (2004), “X-Ray Microanalysis of Real Materials Using Monte Carlo Simulations”, Microchimica Acta, 145, pp. 41 - 47.


29. D. Harbec, J.-L. Meunier, L. Guo, R. Gauvin and N. El Mallah (2004), “Carbon nanotubes from the thermal plasma dissociation of C2Cl4”, Journal of Physics D, 37, pp. 2121 - 2126.


28. R. Gauvin, J.-F. LeBerre, K. Robertson and J. Finch (2002), “Possibility of Charge Contrast Imaging of Polymeric Materials in the VP-SEM”, Scanning, Vol. 25, pp. 240-242.


27. R. Gauvin, B. Griffin, C. Nockolds, M. Phillips and D.C. Joy (2002), “A Method to Measure the Effective Gas Path Length in the Variable Pressure SEM”, Scanning, Vol. 24, pp. 171-174.



26. E. Lifshin and R. Gauvin (2001), “Minimizing Errors in Electron Microprobe Analysis”, Microscopy & Microanalysis, Vol. 7, No. 2, pp. 168-177. 



25. R. Gauvin and E. Lifshin (2000), “Simulation of X-Ray Emission from Rough Surfaces”, Mikrochimica Acta, Vol. 132, pp. 201-204.



24. V. Fortin, S.C. Gujrathi, G. Gagnon, R. Gauvin, J.F. Currie, L. Ouellet et Y. Tremblay (1999), “Effect of in situ Plasma Oxidation of TiN Diffusion Barrier for AlSiCu/Tin/Ti Metallization Structure of Integrated Circuits”, Journal of Vacuum Science and Technology, B17, No.2, pp.423-431.


23. R. Gauvin (1999), “Some Theoretical Considerations in X-Ray Microanalysis in the VP-SEM or ESEM”, Scanning, Vol. 21, pp. 388 - 393.


22. R. Gauvin, D. Drouin and P. Hovington (1999), “The Effect of FSE on X-Ray Microanalysis in the SEM”, Scanning, Vol. 21, pp. 238-245.


21. B.-M. Béchard, R. Gauvin, and N. Pelletier, (1999) “Process Control, or Chaos?”, Quality Engineering, Vol. 12, No. 1, pp. 1-6.



20. E. Lifshin, N. Doganaksov, J. Sirois and R. Gauvin (1998), “Statistical Consideration in EDS”, Microscopy & Microanalysis, Vol. 4, No. 6, pp. 598-604.



19. P. Hovington, D. Drouin and R. Gauvin (1997), “Casino: A New Era of Monte Carlo Code in C Language for Electron Beam Interaction, Part I: Description of the Program”, Scanning, Vol.19, pp. 1-14.


18. D. Drouin, P. Hovington and R. Gauvin (1997), “Casino: A New Era of Monte Carlo Code in C Language for Electron Beam Interaction, Part II: Tabulated Values of Mott Cross Sections”, Scanning, Vol.19,  pp. 20-28


17. P. Hovington, D. Drouin, R. Gauvin, D. C. Joy and N. Evans (1997), “Casino: A New Era of Monte Carlo Code in C Language for Electron Beam Interaction, Part III: Stopping Power at Low Energy”, Scanning, Vol.19, pp. 29-35.


16. R. Gauvin, P. Hovington and D. Drouin (1997), “Choosing the Optimum Accelerating Voltage to Visualize Sub-Micron Precipitates with a Field Emission SEM”, Scanning, Vol. 19, pp. 1-14.


15. D. Drouin, J. Beauvais, R. Lemire, E. Lavallée, R. Gauvin and M. Caron, (1997), “Method for Fabricating Sub-Micron Silicide Structures on Silicon Using a Resistless Electron Beam Lithography Process”, Applied Physic Letters, Vol. 70, pp. 3020-3022.


14. D. Drouin, J. Beauvais, R. Lemire, R. Gauvin and M. Caron (1997), “Resistless Electron Beam Lithography Process for the Fabrication of Sub-50 nm Silicide Structures”, Journal of the Science of Vacuum and Technology B, Nov./Dec., pp. 2269-2273.




13. D.C. Joy, S. Luo, R. Gauvin, P. Hovington and N. Evans (1996), “Experimental Measurements on Electron Stopping Power”, Scanning Microscopy, Vol. 16, pp. 209-220.



12. R. Gauvin, P. Hovington and D. Drouin (1995), “Quantification of Spherical Inclusions in the Scanning Electron Microscope Using Monte Carlo Simulations”, Scanning, Vol. 17, Issue 4, pp. 202-219.


11 R. Gauvin, D.C. Joy and P. Hovington (1995), “A Formula to Explain Electron Backscattering in Solids”, Scanning, Vol. 17, pp. 63-64.


10. R. Gauvin (1995), “A Method to Characterize Diffusion Process Using a Generalized Walk”, Scanning, Vol. 17, pp. 348-354 




9. R. Gauvin and D. Drouin (1994), “Multifractal Description of Electron Scattering in Solids”, Fractals, Vol. 2, No. 2, pp. 229-232.


8. F. Dossou and R. Gauvin (1994), “The Correlation between the Fractal Dimension of Fractured Surfaces and Mechanical Properties of 6061/Al203/10-20 % p”, Fractals, Vol. 2, No. 2, pp. 249-252.


7. D. Drouin, R. Gauvin and D.C. Joy (1994), “A Formula to Compute Angular Distribution of Elastic Scattering of Electrons in Solids From Mott's Theory”, Scanning, Vol. 16, pp. 67-77.



6. R. Gauvin (1993), “A Parameterization of K-Shell Ionization Cross-Section by Electron with an Empirical Modified Bethe's Formula”, Microbeam Analysis, Vol. 2, pp. 253-258.


5. R. Gauvin and D. Drouin (1993), “A Formula to Compute Total Elastic Mott Cross-Sections”, Scanning, Vol. 15, pp. 140-150.




4. R. Gauvin and D. Drouin (1992), “Fractal Behavior of Electron Scattering in Solids”, Scanning, Vol. 14, 6, pp. 313-323.


3. R. Gauvin, G. L'Espérance and S. St-Laurent (1992), “Quantitative X-Ray Microanalysis of Spherical Inclusions Embedded in a Matrix Using a SEM and Monte Carlo Simulations”, Scanning, Vol. 14, pp. 37-48.


2. R. Gauvin (1992), “A Parameterization of the Effects of Fast Secondary Electrons on Cliff-Lorimer K Factors”, Microbeam Analysis, Vol. 1, No. 2, pp. 97-102.


1. R. Gauvin and G. L'Espérance (1992), “A Monte Carlo Code to Simulate the Effect of Fast Secondary Electrons on K Factors and Spatial Resolution in the TEM”, Journal of Microscopy, Vol. 168, pt. 2, pp. 153-167.



0. R. Gauvin and G. L’Espérance (1991), “A new Method for the Determination of the Cnl Parameter of the Bethe Formula of Ionization Cross-Sections Based on the Ratio of K Factors obtained at Different Accelerating Voltage”, Journal of Microscopy, Vol. 163, pt. 3, pp. 295-306.


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© 2014 by the McGill Electron Microscopy Research Group | Raynald Gauvin.

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