Research Application 2 | memrg

top of page

Development of new methods for quantitative X-Ray microanalysis

Nine new methods, each with a Power-Point and the correspondant articles in refereed publications (from the page Articles in Refereed Publications).

Ratio of K factors to determine the c parameters of the Bethe Equation

Ratio of K factors to determine the c parameters of the Bethe Equation

Ratio of K factors to determine the c parameters of the Bethe Equation

Ratio of K factors to determine the c parameters of the Bethe Equation

1/5

1. Ratio of K factors to determine the c parameters of the Bethe Equation

More information in the following papers:

R. Gauvin and G. L’Espérance (1991), “A new Method for the Determination of the Cnl Parameter of the Bethe Formula of Ionization Cross-Sections Based on the Ratio of K Factors obtained at Different Accelerating Voltage”, Journal of Microscopy, Vol. 163, pt. 3, pp. 295-306.

R. Gauvin (2012), “What remains to be done to allow Quantitative X-Ray Microanalysis to become a Characterization Technique used with every EDS Spectra Acquired?”, Invited Paper, Microscopy & Microanalysis, Vol. 18, No. 5, pp. 915 - 940.

Anchor 1

2. Measurement of the Koster-Kronig factors

More information: the following paper:

R. Gauvin (2012), “What remains to be done to allow Quantitative X-Ray Microanalysis to become a Characterization Technique used with every EDS Spectra Acquired?”, Invited Paper, Microscopy & Microanalysis, Vol. 18, No. 5, pp. 915 - 940.

Measurement of the Koster-Kronig factor

Measurement of the Koster-Kronig factor

Measurement of the Koster-Kronig factor

1/2

Anchor 2

3. Effect of fast secondary electrons on X-Ray Microanalysis

More informations in the following papers:

R. Gauvin and G. L'Espérance (1992), “A Monte Carlo Code to Simulate the Effect of Fast Secondary Electrons on K Factors and Spatial Resolution in the TEM”, Journal of Microscopy, Vol. 168, pt. 2, pp. 153-167.

R. Gauvin (2012), “What remains to be done to allow Quantitative X-Ray Microanalysis to become a Characterization Technique used with every EDS Spectra Acquired?”, Invited Paper, Microscopy & Microanalysis, Vol. 18, No. 5, pp. 915 - 940.

Effect of fast secondary electrons on X-Ray microanalysis

Effect of fast secondary electrons on X-Ray microanalysis

Effect of fast secondary electrons on X-Ray microanalysis

Effect of fast secondary electrons on X-Ray microanalysis

1/3

Anchor 3

4. Effect of Auger electrons on X-Ray Microanalysis

More information in the following papers:

R. Gauvin (2012), “What remains to be done to allow Quantitative X-Ray Microanalysis to become a Characterization Technique used with every EDS Spectra Acquired?”, Invited Paper, Microscopy & Microanalysis, Vol. 18, No. 5, pp. 915 - 940.

Effect of Auger electrons on X-Ray Microanalysis

Effect of Auger electrons on X-Ray Microanalysis

Effect of Auger electrons on X-Ray Microanalysis

Effect of Auger electrons on X-Ray Microanalysis

1/4

Anchor 4

5. Development of the f ratio method

More information in the following papers:

P. Horny, E. Lifshin, H. Campbell and R. Gauvin (2010), “Development of a New Quantitative X-Ray Microanalysis Method for Electron Microscopy”, Microscopy & Microanalysis, Vol. 16, No. 6, pp. 821-830.

R. Gauvin (2012), “What remains to be done to allow Quantitative X-Ray Microanalysis to become a Characterization Technique used with every EDS Spectra Acquired?”, Invited Paper, Microscopy & Microanalysis, Vol. 18, No. 5, pp. 915 - 940.

R. Gauvin, N. Brodusch, P. Michaud (2012). "Determination of Diffusion Coefficients with Quantitative X-Ray Microanalysis at High - Spacial Resolution". Defect and Diffusion Forum. Vol - 323-325, pp. 61-67.

Development of the f ratio method

Development of the f ratio method

Development of the f ratio method

Development of the f ratio method

1/6

Anchor 5

6. Quantification of spherical inclusions in the SEM with X-Ray Microanalysis

More information in the following papers:

R. Gauvin, G. L'Espérance and S. St-Laurent (1992), “Quantitative X-Ray Microanalysis of Spherical Inclusions Embedded in a Matrix Using a SEM and Monte Carlo Simulations”, Scanning, Vol. 14, pp. 37-48.

R. Gauvin, P. Hovington and D. Drouin (1995), “Quantification of Spherical Inclusions in the Scanning Electron Microscope Using Monte Carlo Simulations”, Scanning, Vol. 17, Issue 4, pp. 202-219.

Quantification of spherical inclusions in the SEM with X-Ray Microanalysis

Quantification of spherical inclusions in the SEM with X-Ray Microanalysis

Quantification of spherical inclusions in the SEM with X-Ray Microanalysis

Quantification of spherical inclusions in the SEM with X-Ray Microanalysis

1/3

Anchor 6

7. Quantitative X-Ray Microanalysis in the VP-SEM or ESEM

More information in the following papers:

R. Gauvin (1999), “Some Theoretical Considerations in X-Ray Microanalysis in the VP-SEM or ESEM”, Scanning, Vol. 21, pp. 388 - 393.

J.-F. Le Berre, G. P. Demopoulos and R. Gauvin (2007), “Skirting: A Limitation for the Performance of X-ray Microanalysis in the Variable Pressure or Environmental Scanning electron Microscope”, Scanning, 29, pp.114-122.

Quantitative X-Ray Microanalysis in the VP-SEM or ESEM

Quantitative X-Ray Microanalysis in the VP-SEM or ESEM

Quantitative X-Ray Microanalysis in the VP-SEM or ESEM

Quantitative X-Ray Microanalysis in the VP-SEM or ESEM

1/8

Anchor 7

8. New equation for beam broadening in the TEM

More information in the following paper:

R. Gauvin (2012), “What remains to be done to allow Quantitative X-Ray Microanalysis to become a Characterization Technique used with every EDS Spectra Acquired?”, Invited Paper, Microscopy & Microanalysis, Vol. 18, No. 5, pp. 915 - 940.

New equation for beam broadening in the TEM

New equation for beam broadening in the TEM

New equation for beam broadening in the TEM

New equation for beam broadening in the TEM

1/4

Anchor 8

9. New equation for the emitted range of X-Rays in bulk solids

More information in the following paper:

R. Gauvin (2007), “A Universal Equation for the Emission Range of X-Rays from Bulk Specimens”, Microscopy & Microanalysis, 13 (5), pp 354-357.

New equation for emitted range of X-Rays in bulk solids

New equation for emitted range of X-Rays in bulk solids

New equation for emitted range of X-Rays in bulk solids

1/2

Anchor 9

Back to the research applications page

Back to the research main page

bottom of page