Invited Papers in Scientific Meetings with Refereed Proceedings (1992-2003)

 

Go back to 2004-2015

 

2003

48. R. Gauvin (2003), “ Quantitative x-ray microanalysis and imaging at high spatial resolution at low beam energy”, Invited Speaker at the Annual conference of the Groupement National de Microscopie Electronique en Balayage, GN-MEBA, Paris, France, December 1 – 2.

 

47. R. Gauvin, H. Demers, E. Lifshin, P. Horny (2003), “Win X-Ray, The Monte Carlo Program for X-Ray microanalysis in the SEM”, Microscopy & Microanalysis, 9 (Supp. 2), pp. 32 - 33.  Invited Speaker at the conference Microscopy & Microanalysis that was held in San Antonio, USA, from August 3-7. 

 

46. R. Gauvin, P. Horny and E. Lifshin (2003), “On the Contrast and Resolution of Backscattered Images in the SEM”, Microscopy & Microanalysis, 9 (Supp. 2), pp. 970 - 971. Invited Speaker at the conference Microscopy & Microanalysis that was held in San Antonio, USA, from August 3-7.   

 

45. E. Lifshin and R. Gauvin (2003) “Spatial Resolution Limits for X-Ray Microanalysis in Bulk Samples”, Microscopy & Microanalysis, 9 (Supp. 2), pp. 536 - 537. Invited Speaker at the conference Microscopy & Microanalysis that was held in San Antonio, USA, from August 3-7.   

 

44. R. Gauvin (2003), “Low Voltage X-Ray Microanalysis”, Proceedings of the the 30th Annual Conference of the Microscopical Society of Canada, p. 26 – 27. Invited Speaker at this conference that was held in Vancouver, BC, Canada, from June 4-6. 

 

43. R. Gauvin, E. Lifshin (2003), “Monte Carlo Simulation in Heterogeneous Specimens”, Proceedings of the 8th Workshop of European Microbeam Analysis Society (EMAS), pp. 209–225, Invited Speaker at this conference that was held in Cadiz, Spain, from May 18-22.

 

42. R. Gauvin (2003), “High Resolution Imaging in the SEM”, Scanning, Vol. 25, No. 2, p. 48. Invited Speaker at the conference Scanning 2003 which will was held in San Diego, CA, USA, from May 3-5.

 

2002

41. R. Gauvin (2002), “Quantitative X-Ray Microanalysis in the ESEM”, Proceedings of the 15th International Congress on Electron Microscopy (ICEM–15), pp. 1022 – 1023, Invited Speaker at this conference that was held in Durban, South Africa from September 1-6. 

 

40. R. Gauvin, M. Brochu and R. A.L. Drew (2002), “Characterization of Metal-Ceramic Interfaces using X-Ray Microanalysis in a Field-Emission Electron Scanning Microscope”, Proceedings of the International Symposium on Metal/Ceramic Interactions, pp. 93 - 103.  Invited Speaker at the Conference of Metallurgists COM2002 that was held in Montréal, from August 11-14. 

 

39. R. Gauvin and E. Lifshin (2002), “On the Simulation of True EDS X-Ray Spectra”, Microscopy & Microanalysis, 8 (Supp.2), pp. 430-431.  Invited Speaker at the conference Microscopy & Microanalysis that was held in Québec City, Canada, from August 4-9. 

 

38. R. Gauvin (2002), “Physics of Low Voltage Scanning Electron Microscopy”, Microscopy & Microanalysis, 8 (Supp.2), pp. 116 - 117. Invited Speaker at the conference Microscopy & Microanalysis that was held in Québec City, Canada, from August 4-9. 

 

37. R. Gauvin, H. Demers, K. Robertson & J. Finch (2002), “Modeling Contrast in Variable Pressure Scanning Electron Microscopes”, Microscopy & Microanalysis, 8 (Supp.2), pp. 452 - 453.  Invited Speaker at the conference Microscopy & Microanalysis that was held in Québec City, Canada, from August 4-9. 

 

36. R. Gauvin (2002), “Modeling Contrasts in Variable Pressure Scanning electron Microscopes”, Proceedings of the MSA/MAS/SMC/EMAS Workshop “Road Map on Materials Characterization using Microbeam Analysis”, p. 1. Invited Speaker at this workshop that was held in Montréal, Canada, from August 2-3.  

 

2001

35. R. Gauvin (2001), “Quantitative X-Ray Microanalysis of Materials in the ESEM or the VP-SEM”, Microscopy & Microanalysis,7 (Supp.2),p. 692. Invited Speaker at the conference Microscopy & Microanalysis that was held in Long Beach, CA, from August 5-9. 

 

34. R. Gauvin and E. Lifshin (2001), “Quantitative X-Ray Microanalysis of Rough Surfaces”, Microscopy & Microanalysis, 7 (Supp.2), p. 692.  Invited Speaker at the conference Microscopy & Microanalysis that was held in Long Beach, CA, from August 5-9. 

 

33. E. Lifshin, R. Gauvin and D. Wu (2001), “Optimizing Spatial Resolution for X-Ray Microanalysis”, Microscopy & Microanalysis, 7 (Supp.2), pp. 694 - 695.  Invited Speaker at the conference Microscopy & Microanalysis that was held in Long Beach, CA, from August 5-9. 

 

32. R. Gauvin and E. Lifshin (2001), “X-Ray emission from Rough Surfaces”, Proceedings of the 7th European Workshop of the European Microbeam Analysis Society (EMAS), p. 127. Invited Speaker at this conference that was held in Tampere, Finland, from May 6-10. 

 

31. R. Gauvin (2001), “Quantitative X-Ray Microanalysis in the SEM of Heterogeneous Materials”, Scanning, Vol. 23, No. 2, p. 220. Invited Speaker at the conference Scanning 2001 which was held in New York, NY, USA, from May 5-7.

 

30. R. Gauvin (2001), “Simulation of Charging in the ESEM”, Proceedings of the ESEM Roadmap '01 Workshop, pp. 8-9. Invited Speaker at this workshop which was held in Leura, Australia, from February 19-22.

 

29. R. Gauvin (2001), “Monte Carlo Simulations and Multivariate Analysis”, Proceedings of the 5th Conference of the Australian Microbeam Analysis Society and the 2nd Conference of the Scanning Probe Microcopies (AMAS VI /SPM III), pp 12-13. Invited Speaker at this conference that was held in Sydney, Australia, from February 16-19.  

 

2000

28. H. Demers and R. Gauvin (2000), “A New Parameterization of Mott Scattering Cross-Sections for Monte Carlo Simulations”, Microscopy & Microanalysis, Vol. 6, Supp. 2, pp. 926-927. Invited Speaker at the conference Microscopy & Microanalysis which was held in Philadelphia, PA, USA, from August 13-17.

 

27. E. Lifshin and R. Gauvin (2000), “Quantitative X-Ray Microanalysis with Monte Carlo Simulations”, Microscopy & Microanalysis, Vol. 6, Supp. 2, pp. 922-923. Invited Speaker at the conference Microscopy & Microanalysis 2000 which was held in Philadelphia, PA, USA, from August 13-17.

 

26. R. Gauvin and E. Lifshin (2000), “X-Ray Emission from Rough Surfaces”, Institute of Physics Conferences Series Number 165, pp. 285-286. Invited Speaker at the Second International Conference of the International Union of Microbeam Analysis Societies (IUMAS) which was held in Kailua-Kona, Hawaii, USA, from July 9-13.

 

25. R. Gauvin (2000), “On the Contrast and Resolution of Backscattering Images in the FE-SEM”, Institute of Physics Conferences Series Number 165, pp. 245-246. Invited Speaker at the Second International Conference of the International Union of Microbeam Analysis Societies (IUMAS) which was held in Kailua-Kona, Hawaii, USA, from July 9-13.

 

24. E. Lifshin and R. Gauvin (2000), “The Potential of Monte Carlo Calculations for Quantitative Analysis”, Institute of Physics Conferences Series Number 165, pp. 295-296. Invited Speaker at the Second International Conference of the International Union of Microbeam Analysis Societies (IUMAS) which was held in Kailua-Kona, Hawaii, USA, from July 9-13.

 

23. R. Gauvin (2000), “Simulation of Backscattering Images in the FE-SEM”, Scanning, Vol. 22, No. 2, p. 108. Invited Speaker at the conference Scanning 2000 which was held in San Antonio, TX, USA from May 9-12.

 

22. R. Gauvin (2000), “Canadians, Australians and Monte Carlo Modeling – Where is the Truth in Variable Pressure SEM”, Proceedings of the 10th Annual Conference of the Western Australian Society of Electron Microscopy, p. 4. Invited Speaker at this Conference which was held in Perth, Australia, March 22.

 

1999

21. R. Gauvin and E. Lifshin (1999), “Electron Backscattering Profile of Rough Surfaces”, Scanning, Vol. 21, p. 144. Invited Speaker at the conference SCANNING 99 which was held in Chicago, Illinois, USA, from April 11-14.

 

20. R. Gauvin (1999), “VPSEM and Charging: Is it possible to do Monte Carlo simulations”, Proceedings of the ESEM Roadmap '99 Workshop, pp. 17-18. Invited Speaker at this conference which was held in Leura, Australia from February 19-22.

 

19.  R. Gauvin (1999), “Resolution in the SEM”, Proceedings of the 5th Conference of the Australian Microbeam Analysis Society and the 2nd Conference of the Scanning Probe Microcopies (AMAS V /SPM II), pp. 66-67. Invited Speaker at this conference which was held in Sydney, Australia from February 16-19.

 

1998

18. R. Gauvin (1999), “ Quantitative x-ray microanalysis in a field emission scanning electron microscope”, Invited Speaker at the Annual conference of the Groupement National de Microscopie Electronique en Balayage, GN-MEBA, Paris, France, December 2 – 3.

 

17. R. Gauvin (1998), “Low Voltage SEM with Energy Filtration in the SEM”, Microscopy & Microanalysis, Vol. 4, Supp. 2, pp. 206-207. Invited Speaker at the conference Microscopy & Microanalysis '98 which was held in Atlanta from July 10-15.

 

16. R. Gauvin (1998), “High Resolution X-Ray Microanalysis with a FE-SEM and Monte Carlo Simulations”, Proceedings of the 31st annual conference of the International Metallographic Society (IMS), pp. 345 – 346. Invited Speaker at this conference which was held in Ottawa, Canada, from July 26-29.

 

15. R. Gauvin (1998), “Characterization of Inhomogeneous Materials with High Spatial Resolution by X-Ray Microanalysis in the SEM”, Proceedings of the 15th Australian Conference on Electron Microscopy (ACEM-15), pp. 36 – 37. Invited Speaker at this conference which was held in Hobart, Tasmania, Australia, from February 1-6.

 

1997

14. R. Gauvin (1997), “X-Ray Emission of Porous Materials in the Scanning Electron Microscope Computed Using Monte Carlo Simulations”, Microscopy & Microanalysis, Vol. 3, Supp. 2, pp. 883-884. Invited Speaker at the conference Microscopy & Microanalysis '97 which was held in Cleveland, Ohio, USA, from August 10 to 14, 1997.

 

13. R. Gauvin (1997), “A Review of Transmission Electron Microscopy for the Characterization of Materials”, Critical Reviews on Materials and Optical Probe Technique, Vol. CR 69, SPIE Press, pp. 200-229. Invited Speaker at the Annual Conference of the International Society of Optical Engineering, SPIE, which was held in San Diego, CA, USA, from July 27 to August 1.

 

12. J. Beauvais, D. Drouin and R. Gauvin (1997), “SEM Techniques for Materials Characterization”, Critical Reviews on Materials and Optical Probe Technique, Vol. CR 69, SPIE Press, pp. 175-199. Invited Speaker at the Annual Conference of the International Society of Optical Engineering, SPIE, which was held in San Diego, CA, USA, from July 27 to August 1.

 

11. R. Gauvin (1997), “Characterization of Small Precipitates in Materials Using Monte Carlo Simulations and a FEGSEM”, Proceedings of the conference Scanning Microscopy 1997, pp. 256 – 257. Invited Speaker at this conference which was held in Chicago, IL, USA, from May 10-15.

 

10. R. Gauvin (1997), “The Effect of Carbon Contamination on the Backscattering Coefficient at 1 keV”, Scanning, Vol. 19, No. 3, P. 221. Invited Speaker at the conference Scanning 97, Monterey, CA, USA, from April 20 to 22, 1997.

 

9. R. Gauvin, P. Wanjara, R. A. L. Drew et S. Yue (1997), “Characterization of the interface in a TiC reinforced Ti-6%Al-4%V composite using a FEGSEM”, Scanning, Vol. 19, No. 3, p. 197. Invited Speaker at the conference Scanning 97, which was held in Monterey, CA, USA, from April 20 to 22, 1997.

 

1996

8. R. Gauvin (1996), “The Effect of Fast Secondary Electrons on X-Ray Microanalysis in the SEM”, Proceedings of the conference Scanning Microscopy '96, pp. 302 – 303. Invited Speaker at this conference which was held in Washington, D.C., USA, from May 10-15.

 

7. P. Hovington and R. Gauvin (1996), “CASINO: A Monte Carlo Program for Low Energy Applications”, MicroCOSMOPOLITAIN, pp. 79-80. Invited Speaker at the first IUMAS (International Union of Microbeam Analysis Societies) conference which was held in Sydney, Australia, from February 11-16. 

 

1995

6. R. Gauvin (1995), “Simulation of X-Ray and Backscattering SEM Images”, Microbeam Analysis, pp. 355-356. Invited Speaker at the 29th annual conference of the Microbeam Analysis Society, MAS, which was held in Breckenridge, CO, USA, from August 6-11. Participation to a NIST Round Robin.

 

5. R. Gauvin (1995), “Simulation of SEM Images of Rough Surfaces by Monte Carlo”, Microbeam Analysis, pp. 359-360. Invited Speaker at the 29th annual conference of the Microbeam Analysis Society, MAS, which was held in Breckenridge, CO, USA, from August 6-11.

 

4. R. Gauvin (1995), “The Use of Monte Carlo Simulations to Understand the Contrast Mechanism of Multiphase Materials of SEM Images at Low Voltages”, Scanning, Vol. 17, V, pp. 12-13. Invited Speaker at the conference Scanning 95 which was held in Monterey, CA, USA, from March 27-30.

 

1994

3. R. Gauvin (1994), “A Monte Carlo Program to Simulate SEM Analysis of Embedded Inclusions”, Scanning, Vol. 16, IV, pp.1-2. Invited Speaker at the NIST sponsored Workshop Electron Beam / Specimen Interaction for Metrology and Microanalysis in the Scanning Electron Microscope at the scientific conference Scanning 1994 which was held in Charleston, NC, USA, from May 22-25.

 

1993

 

2. R. Gauvin (1993), “Description of Electron Scattering in Solids: Several New Results and a Simple Modelization of the Fractal Dimension”, Scanning Microscopy, Supp. 7, pp. 1-12. Invited Speaker at the 11th Pfefferkorn Conference on the Physics of Generation and Detection of Signals Used for Microcharacterization which was held in Aymerst, MA, USA, from August 9-14, 1992.

 

1992

1. R. Gauvin (1992), “Fractal Description of Electron Scattering in Solids”, Scanning, Vol. 14, II, pp. 1155. Invited Speaker at the conference Scanning '92 which was held in Atlantic City, NJ, USA from May 3-6.

 

Go back to 2004-2015