Tuesday Morning, we will be at:
ADVANCES IN INSTRUMENTATION SYMPOSIA
A01.03 Oliver Wells Memorial Symposium on the Scanning Electron Microscope
Tuesday 10:30 AM, Room: 24
High Resolution Imaging in the FIeld Emission Scanning Electron Microscope at Low Accelerating Voltage and with Energy-Filtration of the Electron Signals; R. Gauvin, N. Brodusch, H. Demers; McGill University; P. Woo, Hitachi High-Technologies Canada Inc.
A07.P2 Microscopy and Spectroscopy for Power Generation and Energy Storage
Tuesday 3:30 PM, Exhibition Hall AB
M&M Student Award Transmission Electron Forward Scattered Diffraction and Low Voltage SEM/STEM Characterization of Binder-Free TiO2 Electrodes; MJ Sussman, N. Brodusch, R. Gauvin, GP Demopoulos; McGill University